elib
DLR-Header
DLR-Logo -> http://www.dlr.de
DLR Portal Home | Imprint | Privacy Policy | Accessibility | Contact | Deutsch
Fontsize: [-] Text [+]

Karnaugh-Veitch Maps as Minimal Formal Contract Between Textual Requirements and Tests: A Use-case Based Technical Analysis

Müllner, Nils Henning (2022) Karnaugh-Veitch Maps as Minimal Formal Contract Between Textual Requirements and Tests: A Use-case Based Technical Analysis. Electronics. Multidisciplinary Digital Publishing Institute (MDPI). doi: 10.3390/electronics11152430. ISSN 2079-9292.

[img] PDF - Preprint version (submitted draft)
399kB

Official URL: https://www.mdpi.com/journal/electronics/special_issues/Software_Reliability

Abstract

Checking that requirements written in natural language hold for a formally implemented system is a complex task. Test steps are commonly implemented manually from the requirements. This process is inherently prone to mistakes as test cases are complex and need to be analyzed sequentially to check, which input/output combinations are tested (although tools allow for explicit tracing). Utilizing Karnaugh-Veitch maps as minimal formal contract between informal requirements and implemented test steps improves this process. KV-maps provide the requirements in a computer-editable way, as the correspond to Boolean formulas. KV-maps further allow to define which test steps are relevant. With both requirements and relevance specification at hand, test steps are automatically generated. The approach is applied on a real-world industrial use-case, a train control management system. Although being generally amenable to permutation testing, the selected use-case emphasizes the potential of the method. The method successfully demonstrates its benefits and may help to disclose flaws in the current manually implemented tests.

Item URL in elib:https://elib.dlr.de/187652/
Document Type:Article
Title:Karnaugh-Veitch Maps as Minimal Formal Contract Between Textual Requirements and Tests: A Use-case Based Technical Analysis
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Müllner, Nils HenningUNSPECIFIEDhttps://orcid.org/0000-0002-6468-4996UNSPECIFIED
Date:2022
Journal or Publication Title:Electronics
Refereed publication:Yes
Open Access:Yes
Gold Open Access:Yes
In SCOPUS:Yes
In ISI Web of Science:Yes
DOI:10.3390/electronics11152430
Editors:
EditorsEmailEditor's ORCID iDORCID Put Code
Zheng, JunjunUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Dohi, TadashiUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Okamura, HiroyukiUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Publisher:Multidisciplinary Digital Publishing Institute (MDPI)
Series Name:Computer Science & Engineering
ISSN:2079-9292
Status:Published
Keywords:IBM Doors; KV-Maps; Karnaugh; Veitch; Permutation Testing; TCMS
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Transport
HGF - Program Themes:Rail Transport
DLR - Research area:Transport
DLR - Program:V SC Schienenverkehr
DLR - Research theme (Project):V - TraCo - Train Control and Management (old)
Location: Braunschweig
Institutes and Institutions:Institute of Transportation Systems > Verification and Validation, BS
Deposited By: Müllner, Nils Henning
Deposited On:28 Jul 2022 09:45
Last Modified:11 Feb 2025 13:55

Repository Staff Only: item control page

Browse
Search
Help & Contact
Information
OpenAIRE Validator logo electronic library is running on EPrints 3.3.12
Website and database design: Copyright © German Aerospace Center (DLR). All rights reserved.