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Optical thickness estimation using MOS data

Pflug, B. and Krawczyk, H. and Gerasch, B. (2000) Optical thickness estimation using MOS data. Journal of Spacecraft Technology, 10 (2), pp. 14-18.

Full text not available from this repository.

Abstract

Present status of algorithms for atmospheric correction of ocean colour observations from space is demonstrated using data of imaging spectrometers MOS. Spectrometer MOS-A is used to identify high altitude transparent scattering layers, which can significantly reduce accuracy of atmospheric correction. Spectrometer MOS-B is used for estimation of aerosol optical thickness and Angstrom-exponent.

Item URL in elib:https://elib.dlr.de/17910/
Document Type:Article
Additional Information: LIDO-Berichtsjahr=1999,
Title:Optical thickness estimation using MOS data
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Pflug, B.UNSPECIFIEDUNSPECIFIED
Krawczyk, H.UNSPECIFIEDUNSPECIFIED
Gerasch, B.UNSPECIFIEDUNSPECIFIED
Date:2000
Journal or Publication Title:Journal of Spacecraft Technology
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Volume:10
Page Range:pp. 14-18
Status:Published
Keywords:Imaging spectrometer MOS; Atmospheric correction; Aerosol optical tickness; Angstrom-exponent
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):UNSPECIFIED
Location: Berlin-Adlershof
Institutes and Institutions:Institut für Weltraumsensorik und Planetenerkundung
Deposited By: DLR-Beauftragter, elib
Deposited On:16 Sep 2005
Last Modified:14 Jan 2010 18:28

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