Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling

Fielitz, P. and Borchardt, G. and Schmücker, M. and Schneider, H. and Willich, P. (2003) Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling. Applied Surface Science, 203-204, pp. 639-643.

Full text not available from this repository.

Item URL in elib:

https://elib.dlr.de/17515/

Document Type:

Article

Additional Information:

LIDO-Berichtsjahr=2003,

Title:

Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling

Authors:

Authors	Institution or Email of Authors	Authors ORCID iD
Fielitz, P.	Technische Universität Clausthal, Clausthal-Zellerfeld, Germany	UNSPECIFIED
Borchardt, G.	Technische Universität Clausthal, Clausthal-Zellerfeld, Germany	UNSPECIFIED
Schmücker, M.	Deutsches Zentrum für Luft- und Raumfahrt, Köln, Germany	UNSPECIFIED
Schneider, H.	Deutsches Zentrum für Luft- und Raumfahrt, Köln, Germany	UNSPECIFIED
Willich, P.	Fraunhofer Institut für Schicht- und Oberflächentechnik, Braunschweig, Germany	UNSPECIFIED

Date:

2003

Journal or Publication Title:

Applied Surface Science

Refereed publication:

Yes

Open Access:

Gold Open Access:

In SCOPUS:

In ISI Web of Science:

Yes

Volume:

203-204

Page Range:

pp. 639-643

Status:

Published

HGF - Research field:

Aeronautics, Space and Transport (old)

HGF - Program:

Aeronautics

HGF - Program Themes:

Propulsion Systems (old)

DLR - Research area:

Aeronautics

DLR - Program:

L ER - Engine Research

DLR - Research theme (Project):

UNSPECIFIED

Location:

Köln-Porz

Institutes and Institutions:

Institute of Materials Research

Deposited By:

DLR-Beauftragter, elib

Deposited On:

16 Sep 2005

Last Modified:

14 Jan 2010 17:52

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