Silicon tracer diffusion in single crystalline 2/1-mullite measured by SIMS depth profiling

Fielitz, P. and Borchardt, G. and Schmücker, M. and Schneider, H. (2003) Silicon tracer diffusion in single crystalline 2/1-mullite measured by SIMS depth profiling. Physical Chemistry Chemical Physics, 5 (11), pp. 2279-2282.

Full text not available from this repository.

Item URL in elib:

https://elib.dlr.de/17514/

Document Type:

Article

Additional Information:

LIDO-Berichtsjahr=2003,

Title:

Silicon tracer diffusion in single crystalline 2/1-mullite measured by SIMS depth profiling

Authors:

Authors	Institution or Email of Authors	Author's ORCID iD	ORCID Put Code
Fielitz, P.	Technische Universität Clausthal, Institut für Metallurgie, Clausthal-Zellerfeld, Germany	UNSPECIFIED	UNSPECIFIED
Borchardt, G.	Technische Universität Clausthal, Institut für Metallurgie, Clausthal-Zellerfeld, Germany	UNSPECIFIED	UNSPECIFIED
Schmücker, M.	Deutsches Zentrum für Luft- und Raumfahrt, Institut für Werkstoff-Forschung, Köln, Germany	UNSPECIFIED	UNSPECIFIED
Schneider, H.	Deutsches Zentrum für Luft- und Raumfahrt, Institut für Werkstoff-Forschung, Köln, Germany	UNSPECIFIED	UNSPECIFIED

Date:

2003

Journal or Publication Title:

Physical Chemistry Chemical Physics

Refereed publication:

Yes

Open Access:

Gold Open Access:

In SCOPUS:

In ISI Web of Science:

Yes

Volume:

Page Range:

pp. 2279-2282

Status:

Published

HGF - Research field:

Aeronautics, Space and Transport (old)

HGF - Program:

Aeronautics

HGF - Program Themes:

Propulsion Systems (old)

DLR - Research area:

Aeronautics

DLR - Program:

L ER - Engine Research

DLR - Research theme (Project):

UNSPECIFIED

Location:

Köln-Porz

Institutes and Institutions:

Institute of Materials Research

Deposited By:

DLR-Beauftragter, elib

Deposited On:

16 Sep 2005

Last Modified:

14 Jan 2010 17:52

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