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Silicon tracer diffusion in single crystalline 2/1-mullite measured by SIMS depth profiling

Fielitz, P. and Borchardt, G. and Schmücker, M. and Schneider, H. (2003) Silicon tracer diffusion in single crystalline 2/1-mullite measured by SIMS depth profiling. Physical Chemistry Chemical Physics, 5 (11), pp. 2279-2282.

Full text not available from this repository.


Item URL in elib:https://elib.dlr.de/17514/
Document Type:Article
Additional Information: LIDO-Berichtsjahr=2003,
Title:Silicon tracer diffusion in single crystalline 2/1-mullite measured by SIMS depth profiling
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Fielitz, P.Technische Universität Clausthal, Institut für Metallurgie, Clausthal-Zellerfeld, GermanyUNSPECIFIED
Borchardt, G.Technische Universität Clausthal, Institut für Metallurgie, Clausthal-Zellerfeld, GermanyUNSPECIFIED
Schmücker, M.Deutsches Zentrum für Luft- und Raumfahrt, Institut für Werkstoff-Forschung, Köln, GermanyUNSPECIFIED
Schneider, H.Deutsches Zentrum für Luft- und Raumfahrt, Institut für Werkstoff-Forschung, Köln, GermanyUNSPECIFIED
Date:2003
Journal or Publication Title:Physical Chemistry Chemical Physics
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Volume:5
Page Range:pp. 2279-2282
Status:Published
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:Propulsion Systems (old)
DLR - Research area:Aeronautics
DLR - Program:L ER - Engine Research
DLR - Research theme (Project):UNSPECIFIED
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research
Deposited By: DLR-Beauftragter, elib
Deposited On:16 Sep 2005
Last Modified:14 Jan 2010 17:52

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