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The use of irradiation facility for the testing of electronic components for space

Budroweit, Jan (2021) The use of irradiation facility for the testing of electronic components for space. NanoInnovation 2021, Rom, Italien.

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Abstract

Radiation testing nowadays becomes more and more important even with the grown NewSpace market where mostly commercial off-the-shelf (COTS) devices are used to reduces the mission costs and to improve the spacecraft performances. However, radiation testing is complex, requires years of experiences and becomes more and more challenging due to modern semiconductors that are getting higher integrated such as known for system-on-chips (SoC). New test methodologies needs to bedeveloped and radiation testing needs be seen in a different way to fulfil the requirements for the NewSpace era. In this talk common and traditional approaches for radiation hardness assurance and testing are presented and new potential testing methods will be proposed.

Item URL in elib:https://elib.dlr.de/144743/
Document Type:Conference or Workshop Item (Speech)
Title:The use of irradiation facility for the testing of electronic components for space
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iD
Budroweit, JanJan.Budroweit (at) dlr.dehttps://orcid.org/0000-0001-7599-0836
Date:2021
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:COTS, Radiation, TID, SEE
Event Title:NanoInnovation 2021
Event Location:Rom, Italien
Event Type:international Conference
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space System Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Space System Technology
DLR - Research theme (Project):R - Compact Satellites FO V
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Budroweit, Jan
Deposited On:20 Oct 2021 08:55
Last Modified:20 Oct 2021 08:55

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