The use of irradiation facility for the testing of electronic components for space

Abstract

Radiation testing nowadays becomes more and more important even with the grown NewSpace market where mostly commercial off-the-shelf (COTS) devices are used to reduces the mission costs and to improve the spacecraft performances. However, radiation testing is complex, requires years of experiences and becomes more and more challenging due to modern semiconductors that are getting higher integrated such as known for system-on-chips (SoC). New test methodologies needs to bedeveloped and radiation testing needs be seen in a different way to fulfil the requirements for the NewSpace era. In this talk common and traditional approaches for radiation hardness assurance and testing are presented and new potential testing methods will be proposed.