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Determination of optical constants from Martian analog materials using a spectro-polarimetric technique

Alemanno, G. and Garcia-Caurel, E. and Carter, J. and Poulet, F. and Brunetto, R. and Alèon-Toppani, A. and Urso, R. and Mivumbi, O. and Boukari, C. and Godard, V. and Borondics, F. (2020) Determination of optical constants from Martian analog materials using a spectro-polarimetric technique. Planetary and Space Science. Elsevier. doi: 10.1016/j.pss.2020.105138. ISSN 0032-0633.

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Official URL: https://www.sciencedirect.com/science/article/abs/pii/S0032063320303512

Abstract

The technique of spectroscopic ellipsometry is a powerful tool for the characterization of the optical properties of materials. This technique represents a significant refinement over the semi-empirical approach to optical constants determination using BRDF (Bidirectional Reflectance Distribution Function) measurements of a finite set of grain sizes for each mineral. It also allows obtaining, not only the optical constants, but also information about the dependence of optical response on sample orientation respect to the illuminating light beam. In this work, we present our experimental approach to derive optical constants of Martian analogue materials based on an infrared ellipsometry technique. We derived the optical constants of gypsum between 750 and 5000 ​cm−1 (2–13 ​μm) using data obtained with an infrared spectroscopic Mueller ellipsometer. Thanks to the high sensitivity of the ellipsometric measurements, and despite of a rather complex data analysis protocol, the results obtained for the gypsum samples show that it is possible to successfully use this technique for direct determination of optical constants of natural minerals. The method discussed here can provide the planetary science community with laboratory derived optical constants of a large number of minerals and materials (either natural or synthetic).

Item URL in elib:https://elib.dlr.de/138552/
Document Type:Article
Title:Determination of optical constants from Martian analog materials using a spectro-polarimetric technique
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iD
Alemanno, G.giulia.alemanno (at) dlr.deUNSPECIFIED
Garcia-Caurel, E.École polytechniqueUNSPECIFIED
Carter, J.Institut d’Astrophysique Spatiale, CNRS Université Paris- Sud, Orsay, FranceUNSPECIFIED
Poulet, F.Institut d'Astrophysique Spatiale, CNRS, Orsay, FrankreichUNSPECIFIED
Brunetto, R.IAS Orsay, FranceUNSPECIFIED
Alèon-Toppani, A.IAS Orsay, FranceUNSPECIFIED
Urso, R.IAS Orsay, FranceUNSPECIFIED
Mivumbi, O.IAS Orsay, FranceUNSPECIFIED
Boukari, C.IAS Orsay, FranceUNSPECIFIED
Godard, V.IAS Orsay, FranceUNSPECIFIED
Borondics, F.Synchrotron SoleilUNSPECIFIED
Date:2020
Journal or Publication Title:Planetary and Space Science
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
DOI :10.1016/j.pss.2020.105138
Publisher:Elsevier
ISSN:0032-0633
Status:Published
Keywords:Optical constants Mars surface Spectroscopy Ellipsometry Laboratory
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Exploration
DLR - Research area:Raumfahrt
DLR - Program:R EW - Space Exploration
DLR - Research theme (Project):R - Projekt ExoMars (old)
Location: Berlin-Adlershof
Institutes and Institutions:Institute of Planetary Research > Planetary Laboratories
Deposited By: Alemanno, Giulia
Deposited On:03 Dec 2020 13:39
Last Modified:03 Dec 2020 13:39

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