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Comparing Raman mapping and electron microscopy for characterizing compositional gradients in thermoelectric materials

Yasseri, Mohammad and Schüpfer, Dominique and Weinhold, Marcel and Chen, Limei and Kamila, Hasbuna and Müller, Eckhard and de Boor, Johannes and Klar, Peter J. (2020) Comparing Raman mapping and electron microscopy for characterizing compositional gradients in thermoelectric materials. Scripta Materialia. Elsevier. doi: 10.1016/j.scriptamat.2020.01.002. ISSN 1359-6462.

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Abstract

We demonstrate that Raman mapping provides a cheap, fast, and non-invasive way of mapping compositional fluctuations occurring in state-of-the-art thermoelectric materials. Exemplarily, we discuss Raman results obtained on an Mg2Si–Mg2Sn diffusion couple and compare resulting compositional mappings with those obtained on the same sample using electron microscopy in conjunction with energy-dispersive X-ray emission and back-scattered electrons as probes. We obtained the same level of quantitative information by the three approaches. The lateral resolution achieved in the Raman mappings can be as good as 1.4 µm and typical recording times per data point are of the order of 50 s.

Item URL in elib:https://elib.dlr.de/135087/
Document Type:Article
Title:Comparing Raman mapping and electron microscopy for characterizing compositional gradients in thermoelectric materials
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iD
Yasseri, MohammadGerman aerospace center, Institute of materials research, Köln, Germany and Justus Liebig university Giessen, Institute of inorganic and analytical chemistry, 35392 Giessen, GermanyUNSPECIFIED
Schüpfer, DominiqueCenter for Materials Research (LaMa) and Institute of Experimental Physics I, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, D-35392 Giessen, GermanyUNSPECIFIED
Weinhold, MarcelCenter for Materials Research (LaMa) and Institute of Experimental Physics I, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, D-35392 Giessen, GermanyUNSPECIFIED
Chen, LimeiCenter for Materials Research (LaMa) and Institute of Experimental Physics I, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, D-35392 Giessen, GermanyUNSPECIFIED
Kamila, HasbunaGerman aerospace center, Institute of materials research, Köln, GermanyUNSPECIFIED
Müller, EckhardGerman Aerospace Center, Institute of Materials Research, Köln, Germany and Institute for Inorganic and Analytical Chemistry, Justus-Liebig-Universität Gießen, Heinrich-Buff-Ring 58, 35392 Gießen, GermanyUNSPECIFIED
de Boor, JohannesGerman aerospace center, institute of materials research, köln, germanyhttps://orcid.org/0000-0002-1868-3167
Klar, Peter J.Center for Materials Research (LaMa) and Institute of Experimental Physics I, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, D-35392 Giessen, GermanyUNSPECIFIED
Date:1 April 2020
Journal or Publication Title:Scripta Materialia
Refereed publication:Yes
Open Access:Yes
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
DOI :10.1016/j.scriptamat.2020.01.002
Publisher:Elsevier
ISSN:1359-6462
Status:Published
Keywords:Raman spectroscopy; Scanning electron microscopy; Thermoelectric materials; Magnesium tin silicide
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space System Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Space System Technology
DLR - Research theme (Project):R - Systemtechnologien (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Thermoelectric Materials and Systems
Deposited By: Yasseri, Mohammad
Deposited On:19 Oct 2020 09:45
Last Modified:01 Apr 2021 03:00

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