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Parametric investigations for frequency-domain lifetime PSP technique (FLIM)

Sato, Hitomi and Yorita, Daisuke and Hilfer, Michael and Henne, Ulrich and Klein, Christian and Saito, Yuji and Nonomura, Taku and Asai, Keisuke (2020) Parametric investigations for frequency-domain lifetime PSP technique (FLIM). In: AIAA Scitech 2020 Forum (0293), 1 - 13. AIAA. AIAA Science and Technology Forum and Exposition 2020, 2020-01-06 - 2020-01-10, Orlando, FL, USA. doi: 10.2514/6.2020-0293. ISBN 978-162410595-1.

Full text not available from this repository.

Official URL: https://doi.org/10.2514/6.2020-0293

Abstract

The effects of measurement parameters on frequency-domain fluorescence lifetime imaging (FLIM) with a new CMOS camera sensor (pco.flim) were investigated. The phase and demodulation indices were calculated from acquired images, and a function for the pressure is constructed. Pressure calibration tests performed with changing measurement parameters illustrate that increasing excitation modulation frequency significantly increases the pressure sensitivity but has a negative effect on a signal-to-noise ratio. The excitation modulation amplitude and its offset should be as high as possible for the reduction of the shot-noise influence. The pressure error calculated from the normalized phase index was the smallest at the modulation frequency of 20 kHz, while that from normalized demodulation index decreased as the modulation frequency increased. An impinging jet test has been conducted and the applicability of FLIM-PSP technique was investigated. Pressure distribution obtained from the test at the modulation frequencies of 20 kHz and 80 kHz were successfully compared to the pressure tap measurements. Considering the pressure error evaluation, the best results using the phase and demodulation indices were obtained at the modulation frequencies of 20 kHz and 80 kHz, respectively.

Item URL in elib:https://elib.dlr.de/134622/
Document Type:Conference or Workshop Item (Speech)
Additional Information:AIAA-2020-0293
Title:Parametric investigations for frequency-domain lifetime PSP technique (FLIM)
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Sato, HitomiTohoku University, JapanUNSPECIFIEDUNSPECIFIED
Yorita, DaisukeUNSPECIFIEDhttps://orcid.org/0000-0002-3934-4527UNSPECIFIED
Hilfer, MichaelUNSPECIFIEDhttps://orcid.org/0000-0002-2881-7130UNSPECIFIED
Henne, UlrichUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Klein, ChristianUNSPECIFIEDhttps://orcid.org/0000-0001-7592-6922140199478
Saito, YujiTohoku University, JapanUNSPECIFIEDUNSPECIFIED
Nonomura, TakuTohoku University, JapanUNSPECIFIEDUNSPECIFIED
Asai, KeisukeTohoku University, Sendai, JapanUNSPECIFIEDUNSPECIFIED
Date:5 January 2020
Journal or Publication Title:AIAA Scitech 2020 Forum
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
DOI:10.2514/6.2020-0293
Page Range:1 - 13
Publisher:AIAA
Series Name:Conference Proceedings online
ISBN:978-162410595-1
Status:Published
Keywords:Pressure-sensitive paint, PSP, lifetime, FLIM
Event Title:AIAA Science and Technology Forum and Exposition 2020
Event Location:Orlando, FL, USA
Event Type:international Conference
Event Start Date:6 January 2020
Event End Date:10 January 2020
Organizer:AIAA
Institution:Deutsches Zentrum für Luft- und Raumfahrt e.V.
Department:AS-EXV
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:fixed-wing aircraft
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Simulation and Validation (old)
Location: Göttingen
Institutes and Institutions:Institute for Aerodynamics and Flow Technology > Experimental Methods, GO
Deposited By: Micknaus, Ilka
Deposited On:08 Jun 2020 13:01
Last Modified:23 Jul 2025 15:04

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