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Comparison of Three-Dimensional Scanning Devices

Deckers, Niklas and Reulke, R. (2019) Comparison of Three-Dimensional Scanning Devices. International Conference on Image and Vision Computing New Zealand 2019, 2019-12-02 - 2019-12-04, Dunedin, New Zealand. doi: 10.1109/IVCNZ48456.2019.8961017.

Full text not available from this repository.

Abstract

There are now a variety of methods and devices for deriving 3D information, e.g. binocular camera (stereo) systems and methods of the class "shape from X". In addition, there are modern recording technologies that simultaneously measure gray scale values and distance (range cameras, TOF cameras). Many of these methods are available through low-cost sensor systems that are simple and fast to use. We propose a simple experimental setup and a processing chain in order to evaluate the quality of the data recorded by these systems. In an experiment with students we demonstrate the usability of this approach and introduce results for selected low-cost sensors.

Item URL in elib:https://elib.dlr.de/133811/
Document Type:Conference or Workshop Item (Speech)
Title:Comparison of Three-Dimensional Scanning Devices
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Deckers, NiklasHU BerlinUNSPECIFIEDUNSPECIFIED
Reulke, R.Institut für Optische SensorsystemeUNSPECIFIEDUNSPECIFIED
Date:2019
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
DOI:10.1109/IVCNZ48456.2019.8961017
Status:Published
Keywords:3D scanning, stereo, time of flight, TOF, quality assessment
Event Title:International Conference on Image and Vision Computing New Zealand 2019
Event Location:Dunedin, New Zealand
Event Type:international Conference
Event Start Date:2 December 2019
Event End Date:4 December 2019
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Earth Observation
DLR - Research theme (Project):R - Optical Technologies and Applications
Location: Berlin-Adlershof
Institutes and Institutions:Institute of Optical Sensor Systems
Deposited By: Dombrowski, Ute
Deposited On:23 Jan 2020 08:27
Last Modified:07 Jun 2024 11:09

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