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Fault-Aware Performance Assessment Approach for Embedded Networks

Malburg, Jan and Janson, Karl and Raik, Jaan and Dannemann, Frank (2019) Fault-Aware Performance Assessment Approach for Embedded Networks. In: Proceedings - 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019. Institute of Electrical and Electronics Engineers Inc.. 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 24-26 April 2019, Cluj-Napoca, Romania. DOI: 10.1109/DDECS.2019.8724670 ISBN 978-172810073-9 ISSN 2473-2117

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Abstract

Current embedded systems are increasingly using networks, be it for connecting different components or in form of Network on Chips in case of Multi-Processor System on Chip. Knowing the performance parameters of those networks, especially in case that parts of the network are damaged, is the key to allow reliable behavior of the system. In this paper, we present an approach for measuring the performance parameters of embedded networks under different load and fault sce- narios. First, the performance parameters of the network are measured in the nominal case. This information is then used to create a model of the network. For this model we provide a simulation environment, which injects faults into the network to evaluate the network under failure scenarios. We evaluated our approach on a Network on Chip consisting of 16 nodes arranged in a 4x4 matrix. Our evaluation shows that our approach can evaluate the fault effects in the network with good quality.

Item URL in elib:https://elib.dlr.de/128841/
Document Type:Conference or Workshop Item (Speech)
Title:Fault-Aware Performance Assessment Approach for Embedded Networks
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Malburg, JanJan.Malburg (at) dlr.deUNSPECIFIED
Janson, KarlKarl.Janson (at) taltech.eeUNSPECIFIED
Raik, JaanUNSPECIFIEDUNSPECIFIED
Dannemann, FrankFrank.Dannemann (at) dlr.dehttps://orcid.org/0000-0002-0636-5866
Date:24 April 2019
Journal or Publication Title:Proceedings - 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
DOI :10.1109/DDECS.2019.8724670
Publisher:Institute of Electrical and Electronics Engineers Inc.
ISSN:2473-2117
ISBN:978-172810073-9
Status:Published
Keywords:Embedded Networks/NoC, analysis, performance, fault effects
Event Title:22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Event Location:Cluj-Napoca, Romania
Event Type:international Conference
Event Dates:24-26 April 2019
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Core Avionics
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Malburg, Jan
Deposited On:04 Sep 2019 08:53
Last Modified:04 Sep 2019 08:53

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