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Rietveld-Methodik �Grundlagen der Probenpräparation & Analysedemonstration mit TOPAS 5

Francke, Alexander (2018) Rietveld-Methodik �Grundlagen der Probenpräparation & Analysedemonstration mit TOPAS 5. [Other]

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Abstract

Institutsvortrag: �Rietveld-Methodik �Grundlagen der Probenpräparation fürs XRD-Messungen zur Rietveld-Analyse. Fallstricke und Hinweise speziell für die Maschinen im Institut für Werkstoff-Forschung. & Anschließende Analysedemonstration mit TOPAS 5 gemessener Daten.

Item URL in elib:https://elib.dlr.de/122710/
Document Type:Other
Title:Rietveld-Methodik �Grundlagen der Probenpräparation & Analysedemonstration mit TOPAS 5
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Francke, AlexanderUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:July 2018
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:Vortragsfolien, Folien, Rietveld Probenpräparation, Grundlagen
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:fixed-wing aircraft
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Structures and Materials (old), E - Impact of Desert Environment (old), V - Energie und Verkehr (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research
Institute of Structures and Design
Institute of Solar Research
Institute of Materials Physics in Space
Deposited By: Francke, Alexander
Deposited On:08 Nov 2018 11:19
Last Modified:08 Nov 2018 11:19

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