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Optoelectronics system for estimating measurement error of Image Pattern Correlation Technique

Poroykov, A. Yu. and Kirmse, Tania and Boden, Fritz and Lapitskiy, K.M. and Ivanova, Yu.V. and Lapitskaya, I.A. (2018) Optoelectronics system for estimating measurement error of Image Pattern Correlation Technique. In: European Test and Telemetry Conference -ettc2018- (7.2), 136 - 142. AMA. ETTC2018, 26.-28. Juni 2018, Nürnberg, Germany. DOI: 10.5162/ettc2018/7.2 ISBN 978-3-9816876-7-5

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Official URL: https://www.ama-science.org/proceedings/details/2806

Abstract

Photogrammetric methods for in-flight deformation measurements have undeniable advantages: e.g. contactless measurements, measuring the entire surface and the relative simplicity of the setup. During the European research projects Advanced In-Flight Measurement Techniques (AIM and AIM2) an implementation of the photogrammetric method – Image Pattern Correlation Technique (IPCT) has been proposed. It had been successfully applied in several flight test campaigns. To evaluate the measurement error of photogrammetric methods either opto-geometric evaluations or digital modeling of synthetic images are commonly used. Some works indicate only error estimation, but without the explanation of its origin. The paper presents an approach for estimating the measurement error for the IPCT. An experimental system is developed including an imitator of the surface deformation and an additional optical sensor for measuring the present surface profile. The error is determined as a difference between the results of the optical sensor and the IPCT. The system allows to simulate a deformation with an amplitude of ±25 mm on a surface area of 380×380 mm2 in increments of 0.5 mm horizontally and 0.001 mm vertically, with a measurement accuracy of 0.075 mm. The system will be outlined in the paper and measurement results are presented.

Item URL in elib:https://elib.dlr.de/122167/
Document Type:Conference or Workshop Item (Speech)
Additional Information:Paper DOI: 10.5162/ettc2018/7.2
Title:Optoelectronics system for estimating measurement error of Image Pattern Correlation Technique
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Poroykov, A. Yu.National Research University "Moscow Power Engineering InstituteUNSPECIFIED
Kirmse, Taniatania.kirmse (at) dlr.deUNSPECIFIED
Boden, Fritzfritz.boden (at) dlr.deUNSPECIFIED
Lapitskiy, K.M.National Research University "Moscow PoweUNSPECIFIED
Ivanova, Yu.V.National Research University "Moscow PoweUNSPECIFIED
Lapitskaya, I.A.National Research University "Moscow PoweUNSPECIFIED
Date:26 June 2018
Journal or Publication Title:European Test and Telemetry Conference -ettc2018-
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
DOI :10.5162/ettc2018/7.2
Page Range:136 - 142
Publisher:AMA
Series Name:European Test and Telemetry Conference -ettc2018-
ISBN:978-3-9816876-7-5
Status:Published
Keywords:Deformationsmesstechnik, Photogrammetrie, IPCT
Event Title:ETTC2018
Event Location:Nürnberg, Germany
Event Type:international Conference
Event Dates:26.-28. Juni 2018
Institution:Deutsches Zentrum für Luft- und Raumfahrt e.V.
Department:AS-EXV
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:fixed-wing aircraft
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Simulation and Validation
Location: Göttingen
Institutes and Institutions:Institute for Aerodynamics and Flow Technology > Experimental Methods, GO
Deposited By: Micknaus, Ilka
Deposited On:21 Nov 2018 11:13
Last Modified:21 Nov 2018 11:13

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