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Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit

Budroweit, Jan and Sznajder, Maciej (2018) Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit. 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2018-07-16 - 2018-07-19, Singapur. doi: 10.1109/IPFA.2018.8452610. ISBN 978-1-5386-4929-9.

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Official URL: https://ieeexplore.ieee.org/document/8452610

Abstract

Software-Defined Radios (SDR) are commonly used in state-of-the-art radio systems and are already well established in the space industry. A SDR usually describes the signal processing of a radio application in software and is often implemented into Field Programmable Gate Arrays (FPGA) or Digital Signal Processors (DSP). Most RF front-ends are strictly specified and realized for an executed application and are thus not re-configurable. With the release of new Radio Frequency Integrated Circuit (RFIC) devices, a significant portion of RF front end specifications have become programmable and alterable. This paper presents the use case and selected radiation test results of such RFIC technologies for small satellite radio applications, primary designed for low earth orbit (LEO) missions.

Item URL in elib:https://elib.dlr.de/121861/
Document Type:Conference or Workshop Item (Poster)
Title:Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Budroweit, JanUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Sznajder, MaciejUNSPECIFIEDhttps://orcid.org/0000-0002-9917-0581UNSPECIFIED
Date:July 2018
Refereed publication:Yes
Open Access:Yes
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
DOI:10.1109/IPFA.2018.8452610
ISBN:978-1-5386-4929-9
Status:Published
Keywords:SDR, Low Earth Orbit, RFIC, TID
Event Title:2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Event Location:Singapur
Event Type:international Conference
Event Start Date:16 July 2018
Event End Date:19 July 2018
Organizer:IEEE
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space System Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Space System Technology
DLR - Research theme (Project):Proj Small Satellite Technology Experiment Platform (old)
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Institute of Space Systems > Mechanic and Thermal Systems
Deposited By: Budroweit, Jan
Deposited On:19 Dec 2018 13:13
Last Modified:24 Apr 2024 20:25

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