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Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit

Budroweit, Jan and Sznajder, Maciej (2018) Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit. In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. IEEE. International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 16-19 July 2018, Singapore. DOI: 10.1109/IPFA.2018.8452610 ISSN 1946-1550

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Official URL: https://ieeexplore.ieee.org/abstract/document/8452610/

Abstract

Software-Defined Radios (SDR) are commonly used in state-of-the-art radio systems and are already well established in the space industry. A SDR usually describes the signal processing of a radio application in software and is often implemented into Field Programmable Gate Arrays (FPGA) or Digital Signal Processors (DSP). Most RF front-ends are strictly specified and realized for an executed application and are thus not re-configurable. With the release of new Radio Frequency Integrated Circuit (RFIC) devices, a significant portion of RF front end specifications have become programmable and alterable. This paper presents the use case and selected radiation test results of such RFIC technologies for small satellite radio applications, primary designed for low earth orbit (LEO) missions.

Item URL in elib:https://elib.dlr.de/121859/
Document Type:Conference or Workshop Item (Poster)
Title:Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Budroweit, JanJan.Budroweit (at) dlr.deUNSPECIFIED
Sznajder, MaciejMaciej.Sznajder (at) dlr.dehttps://orcid.org/0000-0002-9917-0581
Date:2018
Journal or Publication Title:Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Refereed publication:Yes
Open Access:Yes
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
DOI :10.1109/IPFA.2018.8452610
Publisher:IEEE
ISSN:1946-1550
Status:Published
Keywords:TID Radiation Hardness
Event Title:International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Event Location:Singapore
Event Type:international Conference
Event Dates:16-19 July 2018
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):Proj Small Satellite Technology Experiment Platform
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Institute of Space Systems > Mechanic and Thermal Systems
Deposited By: Sznajder, Dr.-Ing. Maciej
Deposited On:27 Sep 2018 11:30
Last Modified:31 Jul 2019 20:19

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