Budroweit, Jan and Sznajder, Maciej (2018) Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit. In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. IEEE. International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2018-07-16 - 2018-07-19, Singapore. doi: 10.1109/IPFA.2018.8452610. ISSN 1946-1550.
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Official URL: https://ieeexplore.ieee.org/abstract/document/8452610/
Abstract
Software-Defined Radios (SDR) are commonly used in state-of-the-art radio systems and are already well established in the space industry. A SDR usually describes the signal processing of a radio application in software and is often implemented into Field Programmable Gate Arrays (FPGA) or Digital Signal Processors (DSP). Most RF front-ends are strictly specified and realized for an executed application and are thus not re-configurable. With the release of new Radio Frequency Integrated Circuit (RFIC) devices, a significant portion of RF front end specifications have become programmable and alterable. This paper presents the use case and selected radiation test results of such RFIC technologies for small satellite radio applications, primary designed for low earth orbit (LEO) missions.
Item URL in elib: | https://elib.dlr.de/121859/ | ||||||||||||
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Document Type: | Conference or Workshop Item (Poster) | ||||||||||||
Title: | Total Ionizing Dose Effects on a Highly Integrated RF Transceiver for Small Satellite Radio Applications in Low Earth Orbit | ||||||||||||
Authors: |
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Date: | 2018 | ||||||||||||
Journal or Publication Title: | Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA | ||||||||||||
Refereed publication: | Yes | ||||||||||||
Open Access: | Yes | ||||||||||||
Gold Open Access: | No | ||||||||||||
In SCOPUS: | Yes | ||||||||||||
In ISI Web of Science: | No | ||||||||||||
DOI: | 10.1109/IPFA.2018.8452610 | ||||||||||||
Publisher: | IEEE | ||||||||||||
ISSN: | 1946-1550 | ||||||||||||
Status: | Published | ||||||||||||
Keywords: | TID Radiation Hardness | ||||||||||||
Event Title: | International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) | ||||||||||||
Event Location: | Singapore | ||||||||||||
Event Type: | international Conference | ||||||||||||
Event Start Date: | 16 July 2018 | ||||||||||||
Event End Date: | 19 July 2018 | ||||||||||||
HGF - Research field: | Aeronautics, Space and Transport | ||||||||||||
HGF - Program: | Space | ||||||||||||
HGF - Program Themes: | Space System Technology | ||||||||||||
DLR - Research area: | Raumfahrt | ||||||||||||
DLR - Program: | R SY - Space System Technology | ||||||||||||
DLR - Research theme (Project): | Proj Small Satellite Technology Experiment Platform (old) | ||||||||||||
Location: | Bremen | ||||||||||||
Institutes and Institutions: | Institute of Space Systems > Avionics Systems Institute of Space Systems > Mechanic and Thermal Systems | ||||||||||||
Deposited By: | Sznajder, Dr.-Ing. Maciej | ||||||||||||
Deposited On: | 27 Sep 2018 11:30 | ||||||||||||
Last Modified: | 24 Apr 2024 20:25 |
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