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Overlayer thickness determination based on XPS no-loss peaks ratio

Afanas'ev, Viktor P. and Kaplya, Pavel S. and Efremenko, Dmitry (2017) Overlayer thickness determination based on XPS no-loss peaks ratio. In: Sources, Interactions with Matter, Detection and Analysis of Low Energy Electrons. SIMDALEE2017, 18.-22. Sept. 2017, Sardinia, Italy.

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Official URL: http://www.iap.tuwien.ac.at/www/_media/simdalee2017/boa_final_simdalee_c2.pdf


Item URL in elib:https://elib.dlr.de/120397/
Document Type:Conference or Workshop Item (Speech)
Title:Overlayer thickness determination based on XPS no-loss peaks ratio
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iD
Afanas'ev, Viktor P.National Research University "Moscow Power Engineering Institute", RussiaUNSPECIFIED
Kaplya, Pavel S.National Research University "Moscow Power Engineering Institute", RussiaUNSPECIFIED
Efremenko, DmitryUNSPECIFIEDUNSPECIFIED
Date:2017
Journal or Publication Title:Sources, Interactions with Matter, Detection and Analysis of Low Energy Electrons
Refereed publication:No
Open Access:Yes
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Editors:
EditorsEmailEditor's ORCID iD
Werner, Wolfgang S.MUNSPECIFIEDUNSPECIFIED
Astasauskas, VytautasUNSPECIFIEDUNSPECIFIED
Ridzel, OlgaUNSPECIFIEDUNSPECIFIED
Status:Published
Keywords:XPS, retrieval, transport equation
Event Title:SIMDALEE2017
Event Location:Sardinia, Italy
Event Type:international Conference
Event Dates:18.-22. Sept. 2017
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Research under Space Conditions
DLR - Research area:Raumfahrt
DLR - Program:R FR - Research under Space Conditions
DLR - Research theme (Project):R - Material Design and New Materials
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > Atmospheric Processors
Deposited By: Efremenko, Dr Dmitry
Deposited On:18 Jun 2018 14:03
Last Modified:31 Jul 2019 20:18

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