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Overlayer thickness determination based on XPS no-loss peaks ratio

Afanas'ev, Viktor P. and Kaplya, Pavel S. and Efremenko, Dmitry (2017) Overlayer thickness determination based on XPS no-loss peaks ratio. In: Sources, Interactions with Matter, Detection and Analysis of Low Energy Electrons. SIMDALEE2017, 18.-22. Sept. 2017, Sardinia, Italy.

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Official URL: http://www.iap.tuwien.ac.at/www/_media/simdalee2017/boa_final_simdalee_c2.pdf


Item URL in elib:https://elib.dlr.de/120397/
Document Type:Conference or Workshop Item (Speech)
Title:Overlayer thickness determination based on XPS no-loss peaks ratio
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Afanas'ev, Viktor P.National Research University "Moscow Power Engineering Institute", RussiaUNSPECIFIED
Kaplya, Pavel S.National Research University "Moscow Power Engineering Institute", RussiaUNSPECIFIED
Efremenko, Dmitrydmitry.efremenko (at) dlr.deUNSPECIFIED
Date:2017
Journal or Publication Title:Sources, Interactions with Matter, Detection and Analysis of Low Energy Electrons
Refereed publication:No
Open Access:Yes
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Editors:
EditorsEmail
Werner, Wolfgang S.MUNSPECIFIED
Astasauskas, VytautasUNSPECIFIED
Ridzel, OlgaUNSPECIFIED
Status:Published
Keywords:XPS, retrieval, transport equation
Event Title:SIMDALEE2017
Event Location:Sardinia, Italy
Event Type:international Conference
Event Dates:18.-22. Sept. 2017
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Research under Space Conditions
DLR - Research area:Raumfahrt
DLR - Program:R FR - Forschung unter Weltraumbedingungen
DLR - Research theme (Project):R - Vorhaben Materialdesign und neue Materialien
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > Atmospheric Processors
Deposited By: Efremenko, Dr Dmitry
Deposited On:18 Jun 2018 14:03
Last Modified:31 Jul 2019 20:18

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