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Designing Reliable Cyber-Physical Systems

Aleksandrowicz, Gadi and Arbel, Eli and Bloem, Roderick and ter Braak, Timon and Devadze, Sergeij and Fey, Görschwin and Jenihhin, Maksim and Jutman, Artur and Kerkhoff, Hans G. and Könighofer, Robert and Koyfman, Shlomit and Malburg, Jan and Moran, Shiri and Raik, Jaan and Rauwerda, Gerard and Riener, Heinz and Röck, Franz and Shibin, Konstantin and Sunesen, Kim and Wan, Jinbo and Zhao, Yong (2017) Designing Reliable Cyber-Physical Systems. In: Forum on Specification and Design Languages, 454, pp. 15-38. Springer International Publishing AG. Lecture Notes in Electrical Engineering book series, Book. doi: 10.1007/978-3-319-62920-9_2. ISBN 978-3-319-62919-3. ISSN 1876-1100.

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Official URL: https://link.springer.com/chapter/10.1007/978-3-319-62920-9_2

Abstract

Cyber-physical systems, that consist of a cyber part a computing System and a physical part the system in the physical environment as well as the respective interfaces between those parts, are omnipresent in our daily lives. The application in the physical environment drives the overall requirements that must be respected when designing the computing system. Here, reliability is a core aspect where some of the most pressing design challenges are: *monitoring failures throughout the computing system, *determining the impact of failures on the application constraints, and *ensuring correctness of the computing system with respect to application-driven requirements rooted in the physical environment. *This chapter gives an overview of the state-of-the-art techniques developed within the Horizon 2020 project IMMORTAL that tackle these challenges throughout the stack of layers of the computing system while tightly coupling the design methodology to the physical requirements. (The chapter is based on the contributions of the special session Designing Reliable Cyber-Physical Systems of the Forum on Specification and Design Languages (FDL) 2016.)

Item URL in elib:https://elib.dlr.de/115773/
Document Type:Conference or Workshop Item (Other)
Title:Designing Reliable Cyber-Physical Systems
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Aleksandrowicz, GadiUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Arbel, EliUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Bloem, RoderickUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
ter Braak, TimonUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Devadze, SergeijUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Jenihhin, MaksimUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Jutman, ArturUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Kerkhoff, Hans G.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Könighofer, RobertUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Koyfman, ShlomitUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Malburg, JanUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Moran, ShiriUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Raik, JaanUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Rauwerda, GerardRecore SystemsUNSPECIFIEDUNSPECIFIED
Riener, HeinzUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Röck, FranzUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Shibin, KonstantinUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Sunesen, Kimrecore systemsUNSPECIFIEDUNSPECIFIED
Wan, JinboUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Zhao, YongUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:11 November 2017
Journal or Publication Title:Forum on Specification and Design Languages
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
Volume:454
DOI:10.1007/978-3-319-62920-9_2
Page Range:pp. 15-38
Editors:
EditorsEmailEditor's ORCID iDORCID Put Code
Fummi, FrancoUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Wille, RobertUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Publisher:Springer International Publishing AG
Series Name:Lecture Notes in Electrical Engineering
ISSN:1876-1100
ISBN:978-3-319-62919-3
Status:Published
Keywords:Adaptive test strategy generation Automatic test case generation Checker minimization Checker qualification Concurrent online checkers Counterexample-guided inductive synthesis CPS Cross-layered fault management Cyber-physical systems Dependable CPSoC Embedded systems Fault classification Fault management infrastructure Fault tolerance Gating-aware error injection Gradual degradation Health monitors Heterogeneous IDDQ IEEE 1687 Many-core NBTI aging Parameter synthesis Reliability analysis Resource management software Run-time resource mapping Satisfiability modulo theories System-on-chip
Event Title:Lecture Notes in Electrical Engineering book series
Event Location:Book
Event Type:Other
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space System Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Space System Technology
DLR - Research theme (Project):R - Systemtechnologien (old)
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Malburg, Jan
Deposited On:09 May 2018 10:10
Last Modified:20 Jun 2021 15:50

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