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Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects

Flenker, Tino and Malburg, Jan and Fey, Görschwin and Avramenko, Serhiy and Violante, Massimo and Sonza Reorda, Matteo (2017) Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects. In: Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI, pp. 533-538. 2017 IEEE Computer Society Annual Symposium on VLSI, 3.-5. Juli 2017, Bochum, Deutschland. DOI: 10.1109/ISVLSI.2017.99 ISBN 978-1-5090-6762-6 ISSN 2159-3477

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Abstract

Fault injection and fault simulation are a typical approach to analyze the effect of a fault on a hardware/software system. Often fault injection is done on abstract models of the system either to retrieve early results when no implementation is available, yet, or to speed-up the runtime intensive fault simulation on detailed models. The simulation results from the abstract model are typically inaccurate because details of the concrete hardware are missing. Here, we propose an approach to relate faults from an abstract untimed algorithmic model to their counterparts in the concrete register transfer models. This allows to understand which faults are covered on the concrete model and to speed up the fault simulation process. We use a mapping between both models' variables and mapped timing states for fault injection to corresponding variables on both models. After fault simulations the results are compared to check, whether a given fault produces the same behavior on both models. The results show that an injected fault to corresponding variables leads to the same behavior of both models for a large share of faults.

Item URL in elib:https://elib.dlr.de/114577/
Document Type:Conference or Workshop Item (Speech)
Title:Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Flenker, TinoUNSPECIFIEDUNSPECIFIED
Malburg, JanJan.Malburg (at) dlr.deUNSPECIFIED
Fey, GörschwinGoerschwin.Fey (at) dlr.deUNSPECIFIED
Avramenko, Serhiyserhiy.avramenko (at) polito.itUNSPECIFIED
Violante, Massimomassimo.violante (at) polito.itUNSPECIFIED
Sonza Reorda, Matteomatteo.sonzareorda (at) polito.itUNSPECIFIED
Date:3 July 2017
Journal or Publication Title:Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
DOI :10.1109/ISVLSI.2017.99
Page Range:pp. 533-538
ISSN:2159-3477
ISBN:978-1-5090-6762-6
Status:Published
Keywords:fault simulation, fault injection, mapping models
Event Title:2017 IEEE Computer Society Annual Symposium on VLSI
Event Location:Bochum, Deutschland
Event Type:international Conference
Event Dates:3.-5. Juli 2017
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Core Avionics, R - Systemtechnologien
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Malburg, Jan
Deposited On:17 Oct 2017 11:47
Last Modified:18 Oct 2017 10:33

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