Segmented Devices and Networking of TE Elements

Abstract

This chapter presents a numerical tool that allows for accurate calculation of the device behavior of a TE element containing an arbitrary spatial variation of the material properties but retains, at least segment-wise, the advantage of analytical description of the temperature profile. The intention behind is to study the element performance in typical gradient situations on an empirical basis by means of numerical calculations. Serial numerical experiments give an overview of how certain gradients of the TE properties may interact. The effects achievable by continuous gradients can be almost entirely accomplished even by segmentations involving merely a low number of different segments. Going beyond this one-dimensional approach, the Millman theorem introduced in the chapter offers a flexible way to treat 1D, 2D, or 3D inhomogeneous geometries represented by a discrete network of nodes and coupling elements in an iterative computation directly referring to the Onsager approach.