Zhou, Aijun and Wang, Weihang and Yao, Xu and Yang, Bin and Li, Jingze and Zhao, Qiang and Wang, Chao and Xu, Dongyan and Ziolkowski, Pawel and Müller, Eckhard (2016) Impact of the film thickness and substrate on the thermopower measurement of thermoelectric films by the potential-Seebeck microprobe (PSM). Applied Thermal Engineering, 107, pp. 552-559. Elsevier. DOI: 10.1016/j.applthermaleng.2016.05.037 ISSN 1359-4311
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Official URL: http://dx.doi.org/10.1016/j.applthermaleng.2016.05.037
Abstract
Thermopower is a key parameter for thermoelectric (TE) materials. Compared to bulk materials, thermopower determination for TE films is challenging especially for those grown on electrically conductive substrates. This work demonstrates the feasibility of the on-substrate thermopower measurement for TE films by the unique potential-Seebeck microprobe (PSM). Thermopower measurements were conducted on the electroplated Bi2Te3 films with different thicknesses prepared on Au-coated Si and quartz substrates in order to reveal the impact of the film thickness and substrate on the measurement accuracy. It is found that the thermopower (Sm) measured on the Bi2Te3 film grown on Si/Au substrates tends to deviate significantly from the real value if the thickness is smaller than 12 m. Above 12 m, no thickness dependence was observed and reliable Sm can be obtained for the Bi2Te3 films. Results on quartz/Au substrates show similar thickness dependence for Sm, but the derived values are much lower than those obtained on Si/Au substrates. Finite element method (FEM) simulations are performed to interpret the measurement discrepancy as well as the impact of the film thickness and substrate on the thermopower measurement by investigating the detailed temperature and potential profiles in the samples.
Item URL in elib: | https://elib.dlr.de/108636/ | |||||||||||||||||||||||||||||||||
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Document Type: | Article | |||||||||||||||||||||||||||||||||
Title: | Impact of the film thickness and substrate on the thermopower measurement of thermoelectric films by the potential-Seebeck microprobe (PSM) | |||||||||||||||||||||||||||||||||
Authors: |
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Date: | 5 May 2016 | |||||||||||||||||||||||||||||||||
Journal or Publication Title: | Applied Thermal Engineering | |||||||||||||||||||||||||||||||||
Refereed publication: | Yes | |||||||||||||||||||||||||||||||||
Open Access: | No | |||||||||||||||||||||||||||||||||
Gold Open Access: | No | |||||||||||||||||||||||||||||||||
In SCOPUS: | Yes | |||||||||||||||||||||||||||||||||
In ISI Web of Science: | Yes | |||||||||||||||||||||||||||||||||
Volume: | 107 | |||||||||||||||||||||||||||||||||
DOI : | 10.1016/j.applthermaleng.2016.05.037 | |||||||||||||||||||||||||||||||||
Page Range: | pp. 552-559 | |||||||||||||||||||||||||||||||||
Publisher: | Elsevier | |||||||||||||||||||||||||||||||||
ISSN: | 1359-4311 | |||||||||||||||||||||||||||||||||
Status: | Published | |||||||||||||||||||||||||||||||||
Keywords: | Thermopower, Thermoelectric films, Potential-Seebeck microprobe, FEM simulation, Substrate, Film thickness | |||||||||||||||||||||||||||||||||
HGF - Research field: | Aeronautics, Space and Transport | |||||||||||||||||||||||||||||||||
HGF - Program: | Aeronautics | |||||||||||||||||||||||||||||||||
HGF - Program Themes: | propulsion systems | |||||||||||||||||||||||||||||||||
DLR - Research area: | Aeronautics | |||||||||||||||||||||||||||||||||
DLR - Program: | L ER - Engine Research | |||||||||||||||||||||||||||||||||
DLR - Research theme (Project): | L - Turbine Technologies | |||||||||||||||||||||||||||||||||
Location: | Köln-Porz | |||||||||||||||||||||||||||||||||
Institutes and Institutions: | Institute of Materials Research > Thermoelectric Materials and Systems | |||||||||||||||||||||||||||||||||
Deposited By: | Yasseri, Mohammad | |||||||||||||||||||||||||||||||||
Deposited On: | 01 Dec 2016 09:53 | |||||||||||||||||||||||||||||||||
Last Modified: | 06 Sep 2019 15:16 |
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