Malburg, Jan and Encrenaz-Tiphene, Emmanuelle and Fey, Görschwin (2014) Mutation based Feature Localization. In: Proceedings - International Workshop on Microprocessor Test and Verification, pp. 49-54. Microprocessor Test and Verification Workshop (MTV), 2014-12-15 - 2014-12-16, Austin, USA. doi: 10.1109/MTV.2014.14. ISBN 978 1 4673 6858 2. ISSN 1550-4093.
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Official URL: http://ieeexplore.ieee.org/document/7087233/
Abstract
The complexity of modern chip designs is rapidly increasing. More and more blocks from old designs are reused and third party IP is licensed to fulfill strict time-to-market constraints. Often, poor documentation of such blocks makes improvements and extensions of the blocks a difficult time consuming task. In this paper we present a technique for automatically localizing the parts of the code which are relevant for a feature. With this a developer can better understand the design and, consequently, can adjust the design more efficiently. The presented approach uses mutants changing the code of the design at a certain location. The code changed by a mutant is considered to be related to a feature if the mutant is killed while the feature is used. The use cases are generated using an automatic approach. This approach is based on a description specifying how the different features are used. Compared to two previous approaches the manual work is significantly reduced and the localization is of similar or even better quality.
| Item URL in elib: | https://elib.dlr.de/106001/ | ||||||||||||||||
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| Document Type: | Conference or Workshop Item (Speech) | ||||||||||||||||
| Title: | Mutation based Feature Localization | ||||||||||||||||
| Authors: |
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| Date: | 2014 | ||||||||||||||||
| Journal or Publication Title: | Proceedings - International Workshop on Microprocessor Test and Verification | ||||||||||||||||
| Refereed publication: | Yes | ||||||||||||||||
| Open Access: | No | ||||||||||||||||
| Gold Open Access: | No | ||||||||||||||||
| In SCOPUS: | Yes | ||||||||||||||||
| In ISI Web of Science: | No | ||||||||||||||||
| DOI: | 10.1109/MTV.2014.14 | ||||||||||||||||
| Page Range: | pp. 49-54 | ||||||||||||||||
| ISSN: | 1550-4093 | ||||||||||||||||
| ISBN: | 978 1 4673 6858 2 | ||||||||||||||||
| Status: | Published | ||||||||||||||||
| Keywords: | Electronic Design Automation, Design Understanding | ||||||||||||||||
| Event Title: | Microprocessor Test and Verification Workshop (MTV) | ||||||||||||||||
| Event Location: | Austin, USA | ||||||||||||||||
| Event Type: | international Conference | ||||||||||||||||
| Event Start Date: | 15 December 2014 | ||||||||||||||||
| Event End Date: | 16 December 2014 | ||||||||||||||||
| Organizer: | IEEE | ||||||||||||||||
| HGF - Research field: | Aeronautics, Space and Transport | ||||||||||||||||
| HGF - Program: | Space | ||||||||||||||||
| HGF - Program Themes: | Space System Technology | ||||||||||||||||
| DLR - Research area: | Raumfahrt | ||||||||||||||||
| DLR - Program: | R SY - Space System Technology | ||||||||||||||||
| DLR - Research theme (Project): | R - Small Sat Kleinsatelliten (old), R - Systemtechnologien (old), R - Core Avionics (old) | ||||||||||||||||
| Location: | Bremen | ||||||||||||||||
| Institutes and Institutions: | Institute of Space Systems > Avionics Systems | ||||||||||||||||
| Deposited By: | Mörz, Martina | ||||||||||||||||
| Deposited On: | 13 Sep 2016 12:34 | ||||||||||||||||
| Last Modified: | 24 Apr 2024 20:11 |
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