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Mutation based Feature Localization

Malburg, Jan and Encrenaz-Tiphene, Emmanuelle and Fey, Görschwin (2014) Mutation based Feature Localization. In: Proceedings - International Workshop on Microprocessor Test and Verification, pp. 49-54. Microprocessor Test and Verification Workshop (MTV), 15.-16. Dez. 2014, Austin, USA. DOI: 10.1109/MTV.2014.14 ISBN 978 1 4673 6858 2 ISSN 1550-4093

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Official URL: http://ieeexplore.ieee.org/document/7087233/

Abstract

The complexity of modern chip designs is rapidly increasing. More and more blocks from old designs are reused and third party IP is licensed to fulfill strict time-to-market constraints. Often, poor documentation of such blocks makes improvements and extensions of the blocks a difficult time consuming task. In this paper we present a technique for automatically localizing the parts of the code which are relevant for a feature. With this a developer can better understand the design and, consequently, can adjust the design more efficiently. The presented approach uses mutants changing the code of the design at a certain location. The code changed by a mutant is considered to be related to a feature if the mutant is killed while the feature is used. The use cases are generated using an automatic approach. This approach is based on a description specifying how the different features are used. Compared to two previous approaches the manual work is significantly reduced and the localization is of similar or even better quality.

Item URL in elib:https://elib.dlr.de/106001/
Document Type:Conference or Workshop Item (Speech)
Title:Mutation based Feature Localization
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Malburg, JanUNSPECIFIEDUNSPECIFIED
Encrenaz-Tiphene, EmmanuelleEmmanuelle.Encrenaz (at) lip6.frUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2014
Journal or Publication Title:Proceedings - International Workshop on Microprocessor Test and Verification
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
DOI :10.1109/MTV.2014.14
Page Range:pp. 49-54
ISSN:1550-4093
ISBN:978 1 4673 6858 2
Status:Published
Keywords:Electronic Design Automation, Design Understanding
Event Title:Microprocessor Test and Verification Workshop (MTV)
Event Location:Austin, USA
Event Type:international Conference
Event Dates:15.-16. Dez. 2014
Organizer:IEEE
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Small Sat Kleinsatelliten (old), R - Systemtechnologien, R - Core Avionics
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Mörz, Martina
Deposited On:13 Sep 2016 12:34
Last Modified:18 Oct 2017 11:21

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