Malburg, Jan und Encrenaz-Tiphene, Emmanuelle und Fey, Görschwin (2014) Mutation based Feature Localization. In: Proceedings - International Workshop on Microprocessor Test and Verification, Seiten 49-54. Microprocessor Test and Verification Workshop (MTV), 2014-12-15 - 2014-12-16, Austin, USA. doi: 10.1109/MTV.2014.14. ISBN 978 1 4673 6858 2. ISSN 1550-4093.
|
PDF
- Nur DLR-intern zugänglich
220kB |
Offizielle URL: http://ieeexplore.ieee.org/document/7087233/
Kurzfassung
The complexity of modern chip designs is rapidly increasing. More and more blocks from old designs are reused and third party IP is licensed to fulfill strict time-to-market constraints. Often, poor documentation of such blocks makes improvements and extensions of the blocks a difficult time consuming task. In this paper we present a technique for automatically localizing the parts of the code which are relevant for a feature. With this a developer can better understand the design and, consequently, can adjust the design more efficiently. The presented approach uses mutants changing the code of the design at a certain location. The code changed by a mutant is considered to be related to a feature if the mutant is killed while the feature is used. The use cases are generated using an automatic approach. This approach is based on a description specifying how the different features are used. Compared to two previous approaches the manual work is significantly reduced and the localization is of similar or even better quality.
| elib-URL des Eintrags: | https://elib.dlr.de/106001/ | ||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dokumentart: | Konferenzbeitrag (Vortrag) | ||||||||||||||||
| Titel: | Mutation based Feature Localization | ||||||||||||||||
| Autoren: |
| ||||||||||||||||
| Datum: | 2014 | ||||||||||||||||
| Erschienen in: | Proceedings - International Workshop on Microprocessor Test and Verification | ||||||||||||||||
| Referierte Publikation: | Ja | ||||||||||||||||
| Open Access: | Nein | ||||||||||||||||
| Gold Open Access: | Nein | ||||||||||||||||
| In SCOPUS: | Ja | ||||||||||||||||
| In ISI Web of Science: | Nein | ||||||||||||||||
| DOI: | 10.1109/MTV.2014.14 | ||||||||||||||||
| Seitenbereich: | Seiten 49-54 | ||||||||||||||||
| ISSN: | 1550-4093 | ||||||||||||||||
| ISBN: | 978 1 4673 6858 2 | ||||||||||||||||
| Status: | veröffentlicht | ||||||||||||||||
| Stichwörter: | Electronic Design Automation, Design Understanding | ||||||||||||||||
| Veranstaltungstitel: | Microprocessor Test and Verification Workshop (MTV) | ||||||||||||||||
| Veranstaltungsort: | Austin, USA | ||||||||||||||||
| Veranstaltungsart: | internationale Konferenz | ||||||||||||||||
| Veranstaltungsbeginn: | 15 Dezember 2014 | ||||||||||||||||
| Veranstaltungsende: | 16 Dezember 2014 | ||||||||||||||||
| Veranstalter : | IEEE | ||||||||||||||||
| HGF - Forschungsbereich: | Luftfahrt, Raumfahrt und Verkehr | ||||||||||||||||
| HGF - Programm: | Raumfahrt | ||||||||||||||||
| HGF - Programmthema: | Technik für Raumfahrtsysteme | ||||||||||||||||
| DLR - Schwerpunkt: | Raumfahrt | ||||||||||||||||
| DLR - Forschungsgebiet: | R SY - Technik für Raumfahrtsysteme | ||||||||||||||||
| DLR - Teilgebiet (Projekt, Vorhaben): | R - Small Sat Kleinsatelliten (alt), R - Systemtechnologien (alt), R - Core Avionics (alt) | ||||||||||||||||
| Standort: | Bremen | ||||||||||||||||
| Institute & Einrichtungen: | Institut für Raumfahrtsysteme > Avioniksysteme | ||||||||||||||||
| Hinterlegt von: | Mörz, Martina | ||||||||||||||||
| Hinterlegt am: | 13 Sep 2016 12:34 | ||||||||||||||||
| Letzte Änderung: | 24 Apr 2024 20:11 |
Nur für Mitarbeiter des Archivs: Kontrollseite des Eintrags