elib
DLR-Header
DLR-Logo -> http://www.dlr.de
DLR Portal Home | Imprint | Privacy Policy | Contact | Deutsch
Fontsize: [-] Text [+]

Analyzing an SET at Gate Level using a Conservative Approach

Thole, Niels and Fey, Görschwin and Garcia-Ortiz, Alberto (2015) Analyzing an SET at Gate Level using a Conservative Approach. Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 01.-03. März 2015, Bad Urach, Deutschland.

[img] PDF - Registered users only
430kB

Abstract

Due to the decreasing size of transistors, the probability of transient errors and the variability of the transistor’s characteristics in electrical circuits continues increasing. These issues demand for techniques to check the robustness of circuits and their behavior under transient errors and conservative variability approximations. We present a conservative algorithm to decide if a transient error leads to faulty output of a circuit. Our approach considers logical, timing, and electrical masking as well as variability in the gates. We model these aspects and transient errors at the gate-level ensuring conservativeness of our analysis. In experiments, we compare our algorithm to precise spice-simulations and show the runtime of our implementation on the ISCAS-85 benchmarks.

Item URL in elib:https://elib.dlr.de/105999/
Document Type:Conference or Workshop Item (Speech)
Title:Analyzing an SET at Gate Level using a Conservative Approach
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Thole, NielsUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Garcia-Ortiz, AlbertoUNSPECIFIEDUNSPECIFIED
Date:2015
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:reliability, robustness Analysis, digital circuits
Event Title:Testmethoden und Zuverlässigkeit von Schaltungen und Systemen
Event Location:Bad Urach, Deutschland
Event Type:Workshop
Event Dates:01.-03. März 2015
Organizer:VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM)
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Small Sat Kleinsatelliten (old), R - Core Avionics, R - Systemtechnologien
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Mörz, Martina
Deposited On:13 Sep 2016 12:30
Last Modified:22 Sep 2016 19:13

Repository Staff Only: item control page

Browse
Search
Help & Contact
Information
electronic library is running on EPrints 3.3.12
Copyright © 2008-2017 German Aerospace Center (DLR). All rights reserved.