Towards analysing Feature Locations through Testing Traces with BUT4Reuse

Martinez, Jabier and Malburg, Jan and Ziadi, Tewfik and Fey, Görschwin (2015) Towards analysing Feature Locations through Testing Traces with BUT4Reuse. Design Automation for Understanding Hardware Designs (DUHDe), 2015-03-13, Grenoble, Frankreich.

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Item URL in elib:

https://elib.dlr.de/105998/

Document Type:

Conference or Workshop Item (Speech)

Title:

Towards analysing Feature Locations through Testing Traces with BUT4Reuse

Authors:

Authors	Institution or Email of Authors	Author's ORCID iD	ORCID Put Code
Martinez, Jabier	jabier.martinez (at) uni.lu	UNSPECIFIED	UNSPECIFIED
Malburg, Jan	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED
Ziadi, Tewfik	Tewfik.Ziadi (at) lip6.fr	UNSPECIFIED	UNSPECIFIED
Fey, Görschwin	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED

Date:

2015

Refereed publication:

Yes

Open Access:

Gold Open Access:

In SCOPUS:

In ISI Web of Science:

Status:

Published

Keywords:

Electronic Design Automation, Design Understanding

Event Title:

Design Automation for Understanding Hardware Designs (DUHDe)

Event Location:

Grenoble, Frankreich

Event Type:

international Conference

Event Date:

13 March 2015

Organizer:

Design, Automation and Test in Europe (DATE)

HGF - Research field:

Aeronautics, Space and Transport

HGF - Program:

Space

HGF - Program Themes:

Space System Technology

DLR - Research area:

Raumfahrt

DLR - Program:

R SY - Space System Technology

DLR - Research theme (Project):

R - Small Sat Kleinsatelliten (old), R - Systemtechnologien (old), R - Core Avionics (old)

Location:

Bremen

Institutes and Institutions:

Institute of Space Systems > Avionics Systems

Deposited By:

Mörz, Martina

Deposited On:

13 Sep 2016 12:28

Last Modified:

24 Apr 2024 20:11

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