Towards analysing Feature Locations through Testing Traces with BUT4Reuse

Martinez, Jabier and Malburg, Jan and Ziadi, Tewfik and Fey, Görschwin (2015) Towards analysing Feature Locations through Testing Traces with BUT4Reuse. Design Automation for Understanding Hardware Designs (DUHDe), 13. März 2015, Grenoble, Frankreich.

Full text not available from this repository.

Item URL in elib:

https://elib.dlr.de/105998/

Document Type:

Conference or Workshop Item (Speech)

Title:

Towards analysing Feature Locations through Testing Traces with BUT4Reuse

Authors:

Authors	Institution or Email of Authors	Authors ORCID iD
Martinez, Jabier	jabier.martinez (at) uni.lu	UNSPECIFIED
Malburg, Jan	UNSPECIFIED	UNSPECIFIED
Ziadi, Tewfik	Tewfik.Ziadi (at) lip6.fr	UNSPECIFIED
Fey, Görschwin	UNSPECIFIED	UNSPECIFIED

Date:

2015

Refereed publication:

Yes

Open Access:

Gold Open Access:

In SCOPUS:

In ISI Web of Science:

Status:

Published

Keywords:

Electronic Design Automation, Design Understanding

Event Title:

Design Automation for Understanding Hardware Designs (DUHDe)

Event Location:

Grenoble, Frankreich

Event Type:

international Conference

Event Dates:

13. März 2015

Organizer:

Design, Automation and Test in Europe (DATE)

HGF - Research field:

Aeronautics, Space and Transport

HGF - Program:

Space

HGF - Program Themes:

Space Technology

DLR - Research area:

Raumfahrt

DLR - Program:

R SY - Technik für Raumfahrtsysteme

DLR - Research theme (Project):

R - Small Sat Kleinsatelliten (old), R - Systemtechnologien, R - Core Avionics

Location:

Bremen

Institutes and Institutions:

Institute of Space Systems > Avionics Systems

Deposited By:

Mörz, Martina

Deposited On:

13 Sep 2016 12:28

Last Modified:

02 Mar 2018 12:22

Repository Staff Only: item control page