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Towards analysing Feature Locations through Testing Traces with BUT4Reuse

Martinez, Jabier and Malburg, Jan and Ziadi, Tewfik and Fey, Görschwin (2015) Towards analysing Feature Locations through Testing Traces with BUT4Reuse. Design Automation for Understanding Hardware Designs (DUHDe), 13. März 2015, Grenoble, Frankreich.

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Item URL in elib:https://elib.dlr.de/105998/
Document Type:Conference or Workshop Item (Speech)
Title:Towards analysing Feature Locations through Testing Traces with BUT4Reuse
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Martinez, Jabierjabier.martinez (at) uni.luUNSPECIFIED
Malburg, JanUNSPECIFIEDUNSPECIFIED
Ziadi, TewfikTewfik.Ziadi (at) lip6.frUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2015
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:Electronic Design Automation, Design Understanding
Event Title:Design Automation for Understanding Hardware Designs (DUHDe)
Event Location:Grenoble, Frankreich
Event Type:international Conference
Event Dates:13. März 2015
Organizer:Design, Automation and Test in Europe (DATE)
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Small Sat Kleinsatelliten (old), R - Systemtechnologien, R - Core Avionics
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Mörz, Martina
Deposited On:13 Sep 2016 12:28
Last Modified:02 Mar 2018 12:22

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