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Counterexample-Guided Diagnosis

Riener, Heinz and Fey, Görschwin (2016) Counterexample-Guided Diagnosis. IEEE International Verification and Security Workshop, 4.-6. Juli 2016, Sant Feliu de Guixols, Spanien. DOI: 10.1109/IVSW.2016.7566605 ISBN 978-150901141-4

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Item URL in elib:https://elib.dlr.de/105971/
Document Type:Conference or Workshop Item (Speech)
Title:Counterexample-Guided Diagnosis
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Riener, HeinzUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2016
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
DOI :10.1109/IVSW.2016.7566605
ISBN:978-150901141-4
Status:Published
Keywords:Debugging
Event Title:IEEE International Verification and Security Workshop
Event Location:Sant Feliu de Guixols, Spanien
Event Type:Workshop
Event Dates:4.-6. Juli 2016
Organizer:IEEE
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Core Avionics, R - Systemtechnologien, R - Small Sat Kleinsatelliten (old)
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Mörz, Martina
Deposited On:08 Sep 2016 09:47
Last Modified:26 Apr 2017 12:59

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