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A Hybrid Algorithm to Conservatively Check the Robustness of Circuits

Thole, Niels and Anghel, Lorena and Fey, Görschwin (2016) A Hybrid Algorithm to Conservatively Check the Robustness of Circuits. In: IEEE European Test Symposium (ETS). Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 06. März 2016, Siegen, Deutschland.

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Abstract

As systems become more complex, the size of transistors decreases. This effect leads to an increased probability of transient faults as well as higher variability of the transistors. Verifying that circuits are robust against transient faults and variability is mandatory. While formal verification may be used to prove robustness, a model that includes extracted electrical parameters and the corresponding timing information is usually too complex in practice. The contribution of this paper consists in a hybrid algorithm that can decide robustness. The algorithm uses Boolean reasoning as well as simulation to decompose the Problem into feasible SAT formulas and still achieves completeness. In our experiments, we compare the algorithm against our previous implementation and achieve an average speed up of 1500 on the ISCAS-85 benchmarks and fault tolerant modifications.

Item URL in elib:https://elib.dlr.de/105965/
Document Type:Conference or Workshop Item (Speech)
Title:A Hybrid Algorithm to Conservatively Check the Robustness of Circuits
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Thole, NielsUNSPECIFIEDUNSPECIFIED
Anghel, LorenaUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2016
Journal or Publication Title:IEEE European Test Symposium (ETS)
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:Robustness, Logic gates, Transient analysis, Circuit faults, Timing, Runtime, Reliability, Formal Methods, Electronic Design Automation
Event Title:Testmethoden und Zuverlässigkeit von Schaltungen und Systemen
Event Location:Siegen, Deutschland
Event Type:international Conference
Event Dates:06. März 2016
Organizer:VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM)
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Small Sat Kleinsatelliten (old), R - Core Avionics, R - Systemtechnologien
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Mörz, Martina
Deposited On:08 Sep 2016 09:43
Last Modified:08 Sep 2016 09:43

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