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Analytical and numerical methods for computing electron partial intensities in the case of multilayer systems

Afanas’ev, Victor P. and Efremenko, Dmitry S. and Kaplya, Pavel S. (2016) Analytical and numerical methods for computing electron partial intensities in the case of multilayer systems. Journal of Electron Spectroscopy and Related Phenomena, 210, pp. 16-29. Elsevier. DOI: 10.1016/j.elspec.2016.04.006 ISSN 0368-2048

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Official URL: http://dx.doi.org/10.1016/j.elspec.2016.04.006

Abstract

We present two novel methods for computing energy spectra and angular distributions of electrons emitted from multi-layer solids. They are based on the Ambartsumian–Chandrasekhar (AC) equations obtained by using the invariant imbedding method. The first method is analytical and relies on a linearization of AC equations and the use of the small-angle approximation. The corresponding solution is in good agreement with that computed by using the Oswald–Kasper–Gaukler (OKG) model, which is extended to the case of layers of finite thickness. The second method is based on the discrete ordinate formalism and relies on a transformation of the AC equations to the algebraic Ricatti and Lyapunov equations, which are solved by using the backward differential formula. Unlike the previous approach, this method can handle both linear and nonlinear equations. We analyze the applicability of the proposed methods to practical problems of computing REELS spectra. To demonstrate the efficiency of the proposed methods, several computational examples are considered. Obtained numerical and analytical solutions show good agreement with the experimental data and Monte-Carlo simulations. In addition, the impact of nonlinear terms in the Ambartsumian–Chandrasekhar equations is analyzed.

Item URL in elib:https://elib.dlr.de/104447/
Document Type:Article
Title:Analytical and numerical methods for computing electron partial intensities in the case of multilayer systems
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Afanas’ev, Victor P.UNSPECIFIEDUNSPECIFIED
Efremenko, Dmitry S.dmitry.efremenko (at) dlr.dehttps://orcid.org/0000-0002-7449-5072
Kaplya, Pavel S.UNSPECIFIEDUNSPECIFIED
Date:July 2016
Journal or Publication Title:Journal of Electron Spectroscopy and Related Phenomena
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
Volume:210
DOI :10.1016/j.elspec.2016.04.006
Page Range:pp. 16-29
Editors:
EditorsEmail
Eberhardt, W.TUB, Berlin, Germany
Hitchcock, A.P.McMaster University, Hamilton, Canada
Kosugi, N.National Institutes of Natural Sciences, Okazaki, Japan
Publisher:Elsevier
ISSN:0368-2048
Status:Published
Keywords:Electron spectroscopy; Multilayer systems; Electron reflection; Transport equations; Small-angle approximation; REELS
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Vorhaben Fernerkundung der Landoberfläche (old)
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > Atmospheric Processors
Deposited By: Efremenko, Dr Dmitry
Deposited On:01 Jun 2016 11:13
Last Modified:01 Jun 2016 11:13

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