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Uncertainty assessment of single-pass TanDEM-X DEMs in selected applications

Rossi, Cristian (2016) Uncertainty assessment of single-pass TanDEM-X DEMs in selected applications. Dissertation, Technical University of Munich.

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SAR interferometry is a well-known technique for producing surface models. In the global scale, the quality of these models significantly increased with the use of bistatic systems such as the German TanDEM-X mission. Quality can be measured in two scales: a global and a local one. A global scale quality analysis involves measures for the complete scene, characterizing the whole correctness with a single parameter. A local scale investigates instead inside the single elevation model cell, discriminating the different quality obtained by the various terrains and media present in the scene. Objective of this research is to define strategies for assessing standard and alternative elevation accuracy methods and to inspect the different capabilities of the bistatic system. Four investigations are carried out for this purpose: agricultural fields (Lake Gala, Turkey), Mediterranean hills (Serra de Collcardus, Spain), subglacial volcanoes (Bardarbunga, Iceland) and cities (Berlin, Germany).

Item URL in elib:https://elib.dlr.de/104086/
Document Type:Thesis (Dissertation)
Title:Uncertainty assessment of single-pass TanDEM-X DEMs in selected applications
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Rossi, Cristiancristian.rossi (at) dlr.deUNSPECIFIED
Refereed publication:No
Open Access:Yes
Gold Open Access:No
In ISI Web of Science:No
Number of Pages:192
Keywords:SAR, InSAR, Digital Elevation Model, TanDEM-X, uncertainty
Institution:Technical University of Munich
Department:Remote Sensing Technology
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Projekt TanDEM-X
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute
Deposited By: Rossi, Cristian
Deposited On:25 Apr 2016 12:24
Last Modified:31 Jul 2019 20:01

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