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Diagnostic Tests and Diagnosis for Delay Faults using Path Segmentation

Flenker, Tino and Sülflow, André and Fey, Görschwin (2015) Diagnostic Tests and Diagnosis for Delay Faults using Path Segmentation. Asian Test Symposium (ATS), Mumbai, Indien.

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Item URL in elib:https://elib.dlr.de/101505/
Document Type:Conference or Workshop Item (Speech)
Title:Diagnostic Tests and Diagnosis for Delay Faults using Path Segmentation
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Flenker, TinoUNSPECIFIEDUNSPECIFIED
Sülflow, AndréUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2015
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 145-150
Status:Published
Keywords:Diagnosis, circuit, electronic design automation, path-delay
Event Title:Asian Test Symposium (ATS)
Event Location:Mumbai, Indien
Event Type:international Conference
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Core Avionics
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Fey, Görschwin
Deposited On:19 Jan 2016 12:01
Last Modified:10 May 2016 23:40

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