elib
DLR-Header
DLR-Logo -> http://www.dlr.de
DLR Portal Home | Imprint | Privacy Policy | Contact | Deutsch
Fontsize: [-] Text [+]

Diagnostic Tests and Diagnosis for Delay Faults using Path Segmentation

Flenker, Tino and Sülflow, André and Fey, Görschwin (2015) Diagnostic Tests and Diagnosis for Delay Faults using Path Segmentation. Asian Test Symposium (ATS), Mumbai, Indien.

Full text not available from this repository.


Item URL in elib:https://elib.dlr.de/101505/
Document Type:Conference or Workshop Item (Speech)
Title:Diagnostic Tests and Diagnosis for Delay Faults using Path Segmentation
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iD
Flenker, TinoUNSPECIFIEDUNSPECIFIED
Sülflow, AndréUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2015
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 145-150
Status:Published
Keywords:Diagnosis, circuit, electronic design automation, path-delay
Event Title:Asian Test Symposium (ATS)
Event Location:Mumbai, Indien
Event Type:international Conference
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space System Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Space System Technology
DLR - Research theme (Project):R - Core Avionics (old)
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Fey, Görschwin
Deposited On:19 Jan 2016 12:01
Last Modified:10 May 2016 23:40

Repository Staff Only: item control page

Browse
Search
Help & Contact
Information
electronic library is running on EPrints 3.3.12
Website and database design: Copyright © German Aerospace Center (DLR). All rights reserved.