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Thole, Niels and Fey, Görschwin and Garcia-Ortiz, Alberto (2015) Conservatively Analyzing Transient Faults. IEEE Annual Symposium on VLSI (ISVLSI), 2015, Montpellier, France. doi: 10.1109/ISVLSI.2015.40.
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Official URL: http://dx.doi.org/10.1109/ISVLSI.2015.40
| Item URL in elib: | https://elib.dlr.de/101504/ | ||||||||||||||||
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| Document Type: | Conference or Workshop Item (Speech) | ||||||||||||||||
| Title: | Conservatively Analyzing Transient Faults | ||||||||||||||||
| Authors: |
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| Date: | 2015 | ||||||||||||||||
| Refereed publication: | Yes | ||||||||||||||||
| Open Access: | No | ||||||||||||||||
| Gold Open Access: | No | ||||||||||||||||
| In SCOPUS: | No | ||||||||||||||||
| In ISI Web of Science: | No | ||||||||||||||||
| DOI: | 10.1109/ISVLSI.2015.40 | ||||||||||||||||
| Page Range: | pp. 50-55 | ||||||||||||||||
| Status: | Published | ||||||||||||||||
| Keywords: | Transient Fault, Circuit, SEU, bit-flip, EDA, electronic design automation | ||||||||||||||||
| Event Title: | IEEE Annual Symposium on VLSI (ISVLSI) | ||||||||||||||||
| Event Location: | Montpellier, France | ||||||||||||||||
| Event Type: | international Conference | ||||||||||||||||
| Event Date: | 2015 | ||||||||||||||||
| HGF - Research field: | Aeronautics, Space and Transport | ||||||||||||||||
| HGF - Program: | Space | ||||||||||||||||
| HGF - Program Themes: | Space System Technology | ||||||||||||||||
| DLR - Research area: | Raumfahrt | ||||||||||||||||
| DLR - Program: | R SY - Space System Technology | ||||||||||||||||
| DLR - Research theme (Project): | R - Core Avionics (old) | ||||||||||||||||
| Location: | Bremen | ||||||||||||||||
| Institutes and Institutions: | Institute of Space Systems > Avionics Systems | ||||||||||||||||
| Deposited By: | Fey, Görschwin | ||||||||||||||||
| Deposited On: | 19 Jan 2016 11:58 | ||||||||||||||||
| Last Modified: | 08 Aug 2025 11:20 |
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