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Conservatively Analyzing Transient Faults

Thole, Niels and Fey, Görschwin and Garcia-Ortiz, Alberto (2015) Conservatively Analyzing Transient Faults. IEEE Annual Symposium on VLSI (ISVLSI), 2015, Montpellier, France.

Full text not available from this repository.

Official URL: http://dx.doi.org/10.1109/ISVLSI.2015.40


Item URL in elib:https://elib.dlr.de/101504/
Document Type:Conference or Workshop Item (Speech)
Title:Conservatively Analyzing Transient Faults
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Thole, NielsUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Garcia-Ortiz, AlbertoUNSPECIFIEDUNSPECIFIED
Date:2015
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 50-55
Status:Published
Keywords:Transient Fault, Circuit, SEU, bit-flip, EDA, electronic design automation
Event Title:IEEE Annual Symposium on VLSI (ISVLSI)
Event Location:Montpellier, France
Event Type:international Conference
Event Dates:2015
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Core Avionics
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Fey, Görschwin
Deposited On:19 Jan 2016 11:58
Last Modified:03 Aug 2016 13:06

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