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A hierarchical Patch Clustering Method for High Resolution TerraSAR-X Images

Yao, Wei and Loffeld, Otmar and Datcu, Mihai (2015) A hierarchical Patch Clustering Method for High Resolution TerraSAR-X Images. In: Proceedings of IEEE International Geoscience and Remote Sensing Symposium (IGARSS), pp. 2370-2373. IEEE Xplore. IEEE International Geoscience and Remote Sensing Symposium (IGARSS) 2015, 2015-07-26 - 2015-07-31, Milan, Italy. doi: 10.1109/IGARSS.2015.7326285.

Full text not available from this repository.

Official URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?&arnumber=7326285

Abstract

In this paper, we present a Gaussian test-based hierarchical clustering method for high-resolution TerraSAR-X images. The purpose is to obtain homogeneous clusters. k-means is used to split image features to create a hierarchical structure. As image feature vectors usually fall into high dimensional feature space, we test different distance metrics, in order to try to tackle the curse of dimensionality problem. With prepared datasets, we evaluate the clustering results by defining a homogeneity percentage. The results show that by using Gabor texture feature, the Gaussian test-based hierarchical patch clustering method is able to obtain homogeneous clusters. Meanwhile, fractional distance or Minkowski distance performs better than Euclidean or Manhatten distance.

Item URL in elib:https://elib.dlr.de/100215/
Document Type:Conference or Workshop Item (Lecture)
Title:A hierarchical Patch Clustering Method for High Resolution TerraSAR-X Images
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Yao, Weiyao (at) zess.uni-siegen.deUNSPECIFIEDUNSPECIFIED
Loffeld, Otmarloffeld (at) zess.uni-siegen.deUNSPECIFIEDUNSPECIFIED
Datcu, Mihaimihai.datcu (at) dlr.deUNSPECIFIEDUNSPECIFIED
Date:July 2015
Journal or Publication Title:Proceedings of IEEE International Geoscience and Remote Sensing Symposium (IGARSS)
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
DOI:10.1109/IGARSS.2015.7326285
Page Range:pp. 2370-2373
Editors:
EditorsEmailEditor's ORCID iDORCID Put Code
UNSPECIFIEDIEEE Org.UNSPECIFIEDUNSPECIFIED
Publisher:IEEE Xplore
Status:Published
Keywords:Hierarchical clustering, Gaussian test, fractional distance, TerraSAR-X.
Event Title:IEEE International Geoscience and Remote Sensing Symposium (IGARSS) 2015
Event Location:Milan, Italy
Event Type:international Conference
Event Start Date:26 July 2015
Event End Date:31 July 2015
Organizer:IEEE Geoscience and Remote Sensing Society
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Earth Observation
DLR - Research theme (Project):R - Vorhaben hochauflösende Fernerkundungsverfahren (old)
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > Photogrammetry and Image Analysis
Deposited By: Schwarz, Gottfried
Deposited On:01 Dec 2015 08:41
Last Modified:17 Jun 2024 13:48

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