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Determination of Material Parameters and Influence of Measured Errors on the Reflection and Backscatter Properties of Realistic Material Arrangements

Preissner, J. Stein, V. (DLR Institut für Hochfrequenztechnik), (1998) Determination of Material Parameters and Influence of Measured Errors on the Reflection and Backscatter Properties of Realistic Material Arrangements. SPIE Proceedings, SPIE Proc., Vd. 3375, pp. 244-255.

Full text not available from this repository.

Abstract

The scattering matrix of a complex object is derived from the Physical Optics Method and the Method of Equivalent Currents. To demonstrate the influence of measurement errors the RCS of a coated metallic plate is evaluated for different material parameter sets which result from measurements with different experimental setups.

Document Type:Article
Additional Information: LIDO-Berichtsjahr=1999,
Title:Determination of Material Parameters and Influence of Measured Errors on the Reflection and Backscatter Properties of Realistic Material Arrangements
Authors:
AuthorsInstitution or Email of Authors
Preissner, J. Stein, V. (DLR Institut für Hochfrequenztechnik), UNSPECIFIED
Date:1998
Journal or Publication Title:SPIE Proceedings
Refereed publication:No
In SCOPUS:No
In ISI Web of Science:No
Volume:SPIE Proc., Vd. 3375
Page Range:pp. 244-255
Status:Published
Keywords:RCS prediction, nonmetallic structures, material parameters, reflection factors, experimental facilities, influence of errors
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Aeronautics
DLR - Program:L ST - Starrflüglertechnologien
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:Institut für Hochfrequenztechnik
Deposited By: Petra Deutinger
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 22:46

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