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Advanced measurement techniques for industrial use

Kompenhans, Jürgen and Klein, Christian and Fey, Uwe and Stasicki, Boleslaw and Koop, Lars (2011) Advanced measurement techniques for industrial use. Seminar Dalian University of Technology, 13. Oct. 2011, Dalian, China.

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Document Type:Conference or Workshop Item (Speech)
Title:Advanced measurement techniques for industrial use
Authors:
AuthorsInstitution or Email of Authors
Kompenhans, JürgenUNSPECIFIED
Klein, ChristianUNSPECIFIED
Fey, UweUNSPECIFIED
Stasicki, Boleslaw UNSPECIFIED
Koop, LarsUNSPECIFIED
Date:2011
Refereed publication:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:Pressure Sensitive Paint (PSP), Temperature Sensitive Paint (TSP), Microphone Array Technique (MAT), Video Stroboscope (QVT)
Event Title:Seminar Dalian University of Technology
Event Location:Dalian, China
Event Type:Other
Event Dates:13. Oct. 2011
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:Aircraft Research
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Flight Physics
Location: Göttingen
Institutes and Institutions:Institute of Aerodynamics and Flow Technology > Experimental Methods
Deposited By: Ilka Micknaus
Deposited On:30 Nov 2011 13:20
Last Modified:21 Dec 2011 12:41

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