Thole, Niels und Anghel, Lorena und Fey, Görschwin (2016) A Hybrid Algorithm to Conservatively Check the Robustness of Circuits. In: IEEE European Test Symposium (ETS). IEEE European Test Symposium (ETS), 2016-05-23 - 2016-05-27, Amsterdam, Niederlande. doi: 10.1109/ETS.2016.7519326. ISBN 978-146739659-2. ISSN 1558-1780.
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Offizielle URL: http://ieeexplore.ieee.org/document/7519326/
Kurzfassung
As systems become more complex, the size of transistors decreases. This effect leads to an increased probability of transient faults as well as higher variability of the transistors. Verifying that circuits are robust against transient faults and variability is mandatory. While formal verification may be used to prove robustness, a model that includes extracted electrical parameters and the corresponding timing information is usually too complex in practice. The contribution of this paper consists in a hybrid algorithm that can decide robustness. The algorithm uses Boolean reasoning as well as simulation to decompose the problem into feasible SAT formulas and still achieves completeness. In our experiments, we compare the algorithm against our previous implementation and achieve an average speed up of 1500 on the ISCAS-85 benchmarks and fault tolerant modifications.
elib-URL des Eintrags: | https://elib.dlr.de/105896/ | ||||||||||||||||
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Dokumentart: | Konferenzbeitrag (Vortrag) | ||||||||||||||||
Titel: | A Hybrid Algorithm to Conservatively Check the Robustness of Circuits | ||||||||||||||||
Autoren: |
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Datum: | 2016 | ||||||||||||||||
Erschienen in: | IEEE European Test Symposium (ETS) | ||||||||||||||||
Referierte Publikation: | Ja | ||||||||||||||||
Open Access: | Nein | ||||||||||||||||
Gold Open Access: | Nein | ||||||||||||||||
In SCOPUS: | Nein | ||||||||||||||||
In ISI Web of Science: | Nein | ||||||||||||||||
DOI: | 10.1109/ETS.2016.7519326 | ||||||||||||||||
ISSN: | 1558-1780 | ||||||||||||||||
ISBN: | 978-146739659-2 | ||||||||||||||||
Status: | veröffentlicht | ||||||||||||||||
Stichwörter: | Robustness, Logic gates, Transient analysis, Circuit faults, Timing, Runtime, Reliability, Formal Methods, Electronic Design Automation | ||||||||||||||||
Veranstaltungstitel: | IEEE European Test Symposium (ETS) | ||||||||||||||||
Veranstaltungsort: | Amsterdam, Niederlande | ||||||||||||||||
Veranstaltungsart: | internationale Konferenz | ||||||||||||||||
Veranstaltungsbeginn: | 23 Mai 2016 | ||||||||||||||||
Veranstaltungsende: | 27 Mai 2016 | ||||||||||||||||
Veranstalter : | IEEE | ||||||||||||||||
HGF - Forschungsbereich: | Luftfahrt, Raumfahrt und Verkehr | ||||||||||||||||
HGF - Programm: | Raumfahrt | ||||||||||||||||
HGF - Programmthema: | Technik für Raumfahrtsysteme | ||||||||||||||||
DLR - Schwerpunkt: | Raumfahrt | ||||||||||||||||
DLR - Forschungsgebiet: | R SY - Technik für Raumfahrtsysteme | ||||||||||||||||
DLR - Teilgebiet (Projekt, Vorhaben): | R - Scosa Onboard Computing (alt), R - Small Sat Kleinsatelliten (alt), R - Core Avionics (alt), R - Systemtechnologien (alt) | ||||||||||||||||
Standort: | Bremen | ||||||||||||||||
Institute & Einrichtungen: | Institut für Raumfahrtsysteme > Avioniksysteme | ||||||||||||||||
Hinterlegt von: | Mörz, Martina | ||||||||||||||||
Hinterlegt am: | 08 Sep 2016 09:15 | ||||||||||||||||
Letzte Änderung: | 24 Apr 2024 20:11 |
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