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A Model-Based Analysis of Surface Scattering Effects in Polarimetric SAR Interferometry

Börner, T. and Papathanassiou, Konstantinos (1998) A Model-Based Analysis of Surface Scattering Effects in Polarimetric SAR Interferometry. In: EUSAR'98, pp. 61-64. VDE-Verlag GmbH. EUSAR'98, Friedrichshafen, 25-27 Mai 1998. ISBN 3-8007-2359-X.

Full text not available from this repository.

Abstract

In this paper we present a stochastic coherent polarimetric scattering model which can be used for interferometric simulation. The objective of this work is to determine the relationship between surface parameters, as surface roughness and dielectric properties, and interferometric observables. We investigate their influences on the coherence of interferograms formed by using different polarizations. The results are compared with the estimates of conventional polarimetric analysis. This allows us to outline possibilities and limitations for the extraction of surface parameters from real data combining interferometric and polarimetric methods.

Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=1999,
Title:A Model-Based Analysis of Surface Scattering Effects in Polarimetric SAR Interferometry
Authors:
AuthorsInstitution or Email of Authors
Börner, T.UNSPECIFIED
Papathanassiou, KonstantinosUNSPECIFIED
Date:1998
Journal or Publication Title:EUSAR'98
Page Range:pp. 61-64
Publisher:VDE-Verlag GmbH
ISBN:3-8007-2359-X
Status:Published
Keywords:Polarimetry, Interferometry, SAR, Model, Surface, Scattering
Event Title:EUSAR'98, Friedrichshafen, 25-27 Mai 1998
Organizer:ITG/VDE, Daimler-Benz Aerospace, FGAN, DLR
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:Institut für Hochfrequenztechnik
Deposited By: elib DLR-Beauftragter
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 22:47

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