Advanced measurement techniques for industrial use: - Pressure Sensitive Paint (PSP) - Temperature Sensitive Paint (TSP) - Microphone Array Technique (MAT) - Video Stroboscope (QVT)
Klein, Christian and Fey, Uwe and Koop, Lars and Stasicki, Boleslaw and Kompenhans, Jürgen (2010) Advanced measurement techniques for industrial use: - Pressure Sensitive Paint (PSP) - Temperature Sensitive Paint (TSP) - Microphone Array Technique (MAT) - Video Stroboscope (QVT). Seminar an der Nanjing University of Aeronautics and Astronautics (NUAA), 13. Sept. 2010, Nanjing, China.
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| Document Type: | Conference or Workshop Item (Speech) | ||||||||||||
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| Title: | Advanced measurement techniques for industrial use: - Pressure Sensitive Paint (PSP) - Temperature Sensitive Paint (TSP) - Microphone Array Technique (MAT) - Video Stroboscope (QVT) | ||||||||||||
| Authors: |
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| Date: | 2010 | ||||||||||||
| Refereed publication: | No | ||||||||||||
| In SCOPUS: | No | ||||||||||||
| In ISI Web of Science: | No | ||||||||||||
| Status: | Published | ||||||||||||
| Keywords: | PSP, TSP, MAT, QVT | ||||||||||||
| Event Title: | Seminar an der Nanjing University of Aeronautics and Astronautics (NUAA) | ||||||||||||
| Event Location: | Nanjing, China | ||||||||||||
| Event Type: | Other | ||||||||||||
| Event Dates: | 13. Sept. 2010 | ||||||||||||
| Organizer: | Nanjing University of Aeronautics and Astronautics (NUAA), Department of Aerodynamics | ||||||||||||
| HGF - Research field: | Aeronautics, Space and Transport | ||||||||||||
| HGF - Program: | Aeronautics | ||||||||||||
| HGF - Program Themes: | L AR - Aircraft Research | ||||||||||||
| DLR - Research area: | Aeronautics | ||||||||||||
| DLR - Program: | L AR - Aircraft Research | ||||||||||||
| DLR - Research theme (Project): | L - Concepts & Integration | ||||||||||||
| Location: | Göttingen | ||||||||||||
| Institutes and Institutions: | Institute of Aerodynamics and Flow Technology > Experimental Methods | ||||||||||||
| Deposited By: | Ilka Micknaus | ||||||||||||
| Deposited On: | 08 Oct 2010 08:52 | ||||||||||||
| Last Modified: | 08 Oct 2010 08:52 |
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