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The Application of Remote Sensing Techniques for Surveys on Forest Damage.

Kirchhof, Werner (1990) The Application of Remote Sensing Techniques for Surveys on Forest Damage. In: Proceedings Intl. and Interdisciplinary Symposium, 12-16 March 1990, Colombo: Ecology and Landscape Management in SrilankaA German Experience J. Margraf, Weikersheim.

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Abstract

For surveys of forest damage of fir, pine, beech and oak stands ten test areas were selected, with a variety of influencing environmental parameters like topography, stand of trees, species. Eight institutions are cooperating, using aerial CIR photos and multispectral scanner data from airborne and satellite platforms. Different image correction and processing methods are applied, including spectral sinature analysis and additional spectroradiometer measurements on the ground. Results obtained indicate that by the use of supervised classification, based on spectral differencesof healthy and damaged classes, good and reliable results can be obtained for larger homogeneous stands using airborne data.

Document Type:Contribution to a Collection
Additional Information: event_title=International and Interdisciplinary Symposium, 12-16 March 1990, Colombo, LIDO-Berichtsjahr=1990, pages=39,
Title:The Application of Remote Sensing Techniques for Surveys on Forest Damage.
Authors:
AuthorsInstitution or Email of Authors
Kirchhof, WernerUNSPECIFIED
Date:1990
Journal or Publication Title:Proceedings Intl. and Interdisciplinary Symposium, 12-16 March 1990, Colombo: Ecology and Landscape Management in SrilankaA German Experience
Refereed publication:Yes
In ISI Web of Science:No
Publisher:J. Margraf, Weikersheim
Status:Published
Keywords:Forest Damage, Multispectral Data, Classification, Survey, Spectral Reflectance Measurements, Remote Sensing
HGF - Research field:UNSPECIFIED
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:UNSPECIFIED
DLR - Program:no assignment
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:Institut für Optoelektronik
Deposited By: elib DLR-Beauftragter
Deposited On:26 Apr 2006
Last Modified:27 Apr 2009 09:32

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