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The Effects of Radiation on Electronic Devices and Circuits

Benemann, A. and Boden, A. and Bräunig, D. and Brumbi, D. and Klein, J. W. and Schott, J- U. and Seifert, C.-C. and Spillekothen, H.-G. and Wulf, F. (1990) The Effects of Radiation on Electronic Devices and Circuits. Kerntechnik, 55 (5), pp. 261-267.

Full text not available from this repository.

Abstract

Radiation damage of semiconductor components constitutes a safety risk for the functioning of circuits when operated in a radiation-exposed environment. Despite the manifold dependences of the radiation damage, fundamental characteristic features are given so that sensitivity graduations of the active component spectrum can be established. A general description of the sensitivity and the most important parameter changes of devices is given by introducing the main damage mechanisms, as displacements of lattice atoms and ionization effects. Recently obtained results from experiments on the radiation susceptibility of charge coupled devices as well as on the influences of single component degradations on circuit behavior are presented.

Document Type:Article
Additional Information: LIDO-Berichtsjahr=1990,
Title:The Effects of Radiation on Electronic Devices and Circuits
Authors:
AuthorsInstitution or Email of Authors
Benemann, A.Ruhr-Universität Bochum
Boden, A.Hahn-Meitner-Institut, Berlin
Bräunig, D.Hahn-Metner-Institut
Brumbi, D.Ruhr-Universität
Klein, J. W.Ruhr-Universität
Schott, J- U.UNSPECIFIED
Seifert, C.-C.Interatom GmbH, Bensberg
Spillekothen, H.-G.Interatom
Wulf, F.Hahn-Meitner-Institut
Date:1990
Journal or Publication Title:Kerntechnik
Refereed publication:Yes
In ISI Web of Science:Yes
Volume:55
Page Range:pp. 261-267
Status:Published
Keywords:Radiation, Circuit
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:Space
DLR - Program:no assignment
DLR - Research theme (Project):UNSPECIFIED
Location: Köln-Porz
Institutes and Institutions:Institute of Aerospace Medicine
Deposited By: elib DLR-Beauftragter
Deposited On:02 Apr 2006
Last Modified:27 Apr 2009 06:15

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