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Application of High-Throughput Seebeck Microprobe Measurements on Thermoelectric Half-Heusler Thin Film Combinatorial Material Libraries

Ziolkowski, Pawel and Wambach, Matthias and Ludwig, Alfred and Müller, Eckhard (2018) Application of High-Throughput Seebeck Microprobe Measurements on Thermoelectric Half-Heusler Thin Film Combinatorial Material Libraries. ACS Combinatorial Science. American Chemical society (ACS). DOI: 10.1021/acscombsci.7b00019 ISSN 2156-8952

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Abstract

In view of the variety and complexity of thermoelectric (TE) material systems, combinatorial approaches to materials development come to the fore for identifying new promising compounds. The success of this approach is related to the availability and reliability of high-throughput characterization methods for identifying interrelations between materials structures and properties within the composition spread libraries. A meaningful characterization starts with determination of the Seebeck coefficient as a major feature of TE materials. Its measurement, and hence the accuracy and detectability of promising material compositions, may be strongly affected by thermal and electrical measurement conditions. This work illustrates the interrelated effects of the substrate material, the layer thickness, and spatial property distributions of thin film composition spread libraries, which are studied experimentally by local thermopower scans by means of the Potential and Seebeck Microprobe (PSM). The study is complemented by numerical evaluation. Material libraries of the half-Heusler compound system Ti-Ni-Sn were deposited on selected substrates (Si, AlN, Al2O3) by magnetron sputtering. Assuming homogeneous properties of a film, significant decrease of the detected thermopower Sm can be expected on substrates with higher thermal conductivity, yielding an underestimation of materials thermopower between 15% and 50%, according to FEM (finite element methods) simulations. Thermally poor conducting substrates provide a better accuracy with thermopower underestimates lower than 8%, but suffer from a lower spatial resolution. According to FEM simulations, local scanning of sharp thermopower peaks on lowly conductive substrates is linked to an additional deviation of the measured thermopower of up to 70% compared to homogeneous films, which is 66% higher than for corresponding cases on substrates with higher thermal conductivity of this study.

Item URL in elib:https://elib.dlr.de/122803/
Document Type:Article
Title:Application of High-Throughput Seebeck Microprobe Measurements on Thermoelectric Half-Heusler Thin Film Combinatorial Material Libraries
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Ziolkowski, PawelGerman Aerospace Center, Institute of Materials Research, Köln, GermanyUNSPECIFIED
Wambach, MatthiasChair of MEMS Materials, Institute for Materials, Ruhr-University Bochum, Universitaetsstrasse 150, D-44801 Bochum, GermanyUNSPECIFIED
Ludwig, AlfredChair of MEMS Materials, Institute for Materials, Ruhr-University Bochum, Universitaetsstrasse 150, D-44801 Bochum, GermanyUNSPECIFIED
Müller, EckhardGerman Aerospace Center, Institute of Materials Research, Köln, Germany and Justus Liebig University Giessen, Institute of Inorganic and Analytical Chemistry, 35392 Giessen, GermanyUNSPECIFIED
Date:8 January 2018
Journal or Publication Title:ACS Combinatorial Science
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
DOI :10.1021/acscombsci.7b00019
Publisher:American Chemical society (ACS)
ISSN:2156-8952
Status:Published
Keywords:Potential and Seebeck Microprobe, Seebeck coefficient, Combinatorial material development, Half-Heusler compounds, High-throughput characterization. Measurement accuracy, Spatial resolution, Thermoelectric, Thin films
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Systemtechnologien
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Thermoelectric Materials and Systems
Deposited By: Yasseri, Mohammad
Deposited On:13 Nov 2018 08:37
Last Modified:13 Nov 2018 08:37

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