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A Fast Double Shutter for CCD-Based Metrology

Geisler, Reinhard (2017) A Fast Double Shutter for CCD-Based Metrology. In: Proceedings of SPIE (10328). The 31st International Congress on High-speed Imaging and Photonics, 07. - 10. Nov. 2016, Osaka, Japan. DOI: 10.1117/12.2275695 ISSN 0277-786X

Full text not available from this repository.

Abstract

Image based metrology such as Particle Image Velocimetry (PIV) depends on the comparison of two images of an object taken in fast succession. Cameras for these applications provide the so-called 'double shutter' mode: One frame is captured with a short exposure time and in direct succession a second frame with a long exposure time can be recorded. The difference in the exposure times is typically no problem since illumination is provided by a pulsed light source such as a laser and the measurements are performed in a darkened environment to prevent ambient light from accumulating in the long second exposure time. However, measurements of self-luminous processes (e.g. plasma, combustion ... ) as weil as experiments in ambient light are difficult to perform and require special equipment (external shutters, highspeed image sensors, multi-sensor systems ... ). Unfortunately, all these methods incorporate different drawbacks such as reduced resolution, degraded image quality, decreased light sensitivity or increased susceptibility to decalibration. In the solution presented here, off-the-shelf CCD sensors are used with a special timing to combine neighbouring pixels in a binning-like way. As a result, two frames of short exposure time can be captured in fast succession. They are stored in the on-chip vertical register in a line-interleaved pattern, read out in the common way and separated again by software. The two resultant frames are completely congruent; they expose no insensitive lines or line shifts and thus enable sub-pixel accurate measurements. A third frame can be captured at the full resolution analogue to the double shutter technique. Image based measurement techniques such as PIV can benefit from this mode when applied in bright environments. The third frame is useful e.g. for acceleration measurements or for particle tracking applications. © (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Item URL in elib:https://elib.dlr.de/118390/
Document Type:Conference or Workshop Item (Speech)
Additional Information:Selected Papers from the 31st International Congress on High-Speed lmaging and Photonics, edited by Hiroyuki Shiraga. Takeharu Goji Etoh, Proc. of SPIE Vol. 10328, 1032801; Paper DOI: 10.1117/12.2269099
Title:A Fast Double Shutter for CCD-Based Metrology
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Geisler, Reinhardreinhard.geisler (at) dlr.deUNSPECIFIED
Date:2017
Journal or Publication Title:Proceedings of SPIE
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
DOI :10.1117/12.2275695
Series Name:SPIE Proseedings
ISSN:0277-786X
Status:Published
Keywords:CCD, double shutter, Particle Image Velocimetry (PIV), Particle Tracking Velocimetry (PTV)
Event Title:The 31st International Congress on High-speed Imaging and Photonics
Event Location:Osaka, Japan
Event Type:international Conference
Event Dates:07. - 10. Nov. 2016
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:fixed-wing aircraft
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Simulation and Validation
Location: Göttingen
Institutes and Institutions:Institute for Aerodynamics and Flow Technology > Experimental Methods, GO
Deposited By: Bachmann, Barbara
Deposited On:23 Jan 2018 14:12
Last Modified:31 Jan 2018 14:23

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