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IR measurements and image processing for enhanced vision systems in civil aviation

Beier, Kurt and Fries, Jochen and Müller, Rupert and Palubinskas, Gintautas (2001) IR measurements and image processing for enhanced vision systems in civil aviation. In: Proceedings of SPIE, Vol. 4363, pp. 207-218. SPIE. Enhanced and Synthetic Vision 2001, Orlando, USA, 16-17.4.2001.

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Abstract

A series of IR measurements with a FLIR (Forward Looking Infrared) system during landing approaches to various airports have been performed. A real time image processing procedure to detect and identify the runway and eventual obstacles is discussed and demonstrated. It is based on IR image segmentation and information derived from synthetic vision data. Thhe extracted information from IR images will be combined with the appropriate information from a MMW (millimeter wave) radar sensor in the subsequent fusion processor. This fused information aims to increase the pilot's situation awareness.

Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=2002,
Title:IR measurements and image processing for enhanced vision systems in civil aviation
Authors:
AuthorsInstitution or Email of Authors
Beier, KurtUNSPECIFIED
Fries, JochenUNSPECIFIED
Müller, RupertUNSPECIFIED
Palubinskas, GintautasUNSPECIFIED
Date:2001
Journal or Publication Title:Proceedings of SPIE
Volume:Vol. 4363
Page Range:pp. 207-218
Editors:
EditorsEmail
Jacques G. Verly, UNSPECIFIED
Editor, UNSPECIFIED
Publisher:SPIE
Series Name:Enhanced and Synthetic Vision
Status:Published
Keywords:Enhanced Vision Sytem, IR aircraft measurements, landing approach, IR image processing, synthetic vision data
Event Title:Enhanced and Synthetic Vision 2001, Orlando, USA, 16-17.4.2001
Organizer:SPIE
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Aeronautics
DLR - Program:L FT - Flugführungstechnologien
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute
Deposited By: Cornelia Roehl
Deposited On:25 Jan 2006
Last Modified:06 Jan 2010 22:09

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