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Radar Backscatter Characterization Approach Combining Global TanDEM-X Data

Rizzoli, Paola and Bräutigam, Benjamin (2012) Radar Backscatter Characterization Approach Combining Global TanDEM-X Data. In: Proceedings of the IEEE International Geoscience and Remote Sensing Symposium (IGARSS), pp. 1-4. IEEE. IEEE International Geoscience and Remote Sensing Symposium (IGARSS), 2012-07-22 - 2012-07-27, Munich, Germany.

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Abstract

Global radar backscatter data can be used for accurate performance estimation and instrument setting optimization for Synthetic Aperture Radar (SAR) systems, e.g. in the TerraSAR-X and TanDEM-X missions. Both missions offer global remote sensing data in order to characterize X-band backscatter by performing a statistical analysis on SAR image quicklooks. A new approach for the estimation of radar backscatter for any polarization, ground classification type and incidence angle is presented, recurring to the use of SAR data coming from the TanDEM-X mission. The introduction of topographical information on the illuminated ground area allows for the discrimination of backscatter samples which are not affected by shadowing and layover, increasing the reliability of the estimation approach. The analysis technique is presented, leading to the generation of a set of X-band backscatter models. First results, obtained using TanDEM-X SAR data, are introduced.

Document Type:Conference or Workshop Item (Speech)
Additional Information:©2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Title:Radar Backscatter Characterization Approach Combining Global TanDEM-X Data
Authors:
AuthorsInstitution or Email of Authors
Rizzoli, PaolaUNSPECIFIED
Bräutigam, BenjaminUNSPECIFIED
Date:25 July 2012
Journal or Publication Title:Proceedings of the IEEE International Geoscience and Remote Sensing Symposium (IGARSS)
Refereed publication:Yes
Page Range:pp. 1-4
Publisher:IEEE
Status:Published
Keywords:TerraSAR-X, TanDEM-X, X-band, SAR, backscatter
Event Title:IEEE International Geoscience and Remote Sensing Symposium (IGARSS)
Event Location:Munich, Germany
Event Type:international Conference
Event Dates:2012-07-22 - 2012-07-27
Organizer:IEEE
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Projekt TanDEM-X
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute
Microwaves and Radar Institute > Spaceborne SAR Systems
Deposited By: Paola Rizzoli
Deposited On:13 Jun 2012 14:23
Last Modified:21 Mar 2014 15:07

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