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Radiation Testing of Electronic Devices

Cosic, Donny (2009) Radiation Testing of Electronic Devices. DLR-Interner Bericht. DLR-IB 515-2009/16, 49 S.

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Kurzfassung

Space is filled with many different types of radiation, but for most satellite application only the radiation trapped in Earth’s magnetosphere is of primary concern. This trapping effect generates the Van Allen Radiation Belts which expose satellite electronics to high energy protons and electrons. In order to increase the probability that new space hardware will survive in this environment requires rigorous testing. Moving away from classical shielding methods, where the shield and the device are two separate identities, brings many mass and performance benefits to satellite manufactures and operators, however this is only possible through radiation testing. This paper presents some of the mechanisms behind radiation induced failures in electronic devices and testing methods developed to simulate the radiation environment here on Earth. Additionally, the preparation process for such a test and some test results are also presented to give an overview of the whole testing procedure involved in qualifying equipment for space use.

Dokumentart:Berichtsreihe (DLR-Interner Bericht)
Titel:Radiation Testing of Electronic Devices
Autoren:
AutorenInstitution oder E-Mail-Adresse der Autoren
Cosic, DonnyNICHT SPEZIFIZIERT
Datum:30 August 2009
Seitenanzahl:49
Status:veröffentlicht
Stichwörter:Radiation, Testing, Electronic, Device, satellite
Institution:International Space University, Strasbourg, France
HGF - Forschungsbereich:Verkehr und Weltraum (alt)
HGF - Programm:Weltraum (alt)
HGF - Programmthema:W SY - Technik für Raumfahrtsysteme
DLR - Schwerpunkt:Weltraum
DLR - Forschungsgebiet:W SY - Technik für Raumfahrtsysteme
DLR - Teilgebiet (Projekt, Vorhaben):W - Vorhaben On-Orbit Servicing (alt)
Standort: Oberpfaffenhofen
Institute & Einrichtungen:Institut für Robotik und Mechatronik > Robotersysteme
Hinterlegt von: Jessica Laskey
Hinterlegt am:15 Dez 2009 16:36
Letzte Änderung:12 Dez 2013 20:48

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