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Application of Multi-Look Techniques for Interferometric SAR Data

Scheiber, R. and Bothale, V.M. (2002) Application of Multi-Look Techniques for Interferometric SAR Data. In: EUSAR 2002, pp. 77-80. VDE. EUSAR, Köln, 4-6 Juni, 2002. ISBN 3-8007-2697-1.

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Abstract

Two different multi-look techniques for interferometric SAR data are investigated in this paper. The first one uses the box-car type of filter on the complex interferogram in the spatial domain, whereas the second one performs look-wise filtering of the individual images in the spectral do-main. The investigation starts with the analytical compari-son of the two techniques and the experimental analysis of interferometric phase noise reduction. Next, it is show that the flexibility of the spectral domain multi-look technique can be used for improved motion compensation and fur-ther for precisely updated estimation of azimuth misregis-tration offsets. This leads finally to the compensation of residual motion errors in case of multi-pass SAR interfe-rometry. The comparison is quantified using data of the DLR owned airborne E-SAR system.

Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=2002,
Title:Application of Multi-Look Techniques for Interferometric SAR Data
Authors:
AuthorsInstitution or Email of Authors
Scheiber, R.UNSPECIFIED
Bothale, V.M.UNSPECIFIED
Date:2002
Journal or Publication Title:EUSAR 2002
Page Range:pp. 77-80
Editors:
EditorsEmail
ITG/VDE, UNSPECIFIED
Publisher:VDE
ISBN:3-8007-2697-1
Status:Published
Keywords:interferometry, multi-look, motion compensation
Event Title:EUSAR, Köln, 4-6 Juni, 2002
Organizer:VDE-ITG
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute
Deposited By: elib DLR-Beauftragter
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 19:40

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