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Knowledge-based quality assessment and improvement of digital elevation models from interferometric SAR data

Jäger, G. and Benz, U. and Scheiber, R. (2000) Knowledge-based quality assessment and improvement of digital elevation models from interferometric SAR data. In: EUSAR 2000 Proceedings, pp. 335-338. VDE-Verlag Berlin Offenbach. EUSAR 2000, München, 23.-25.05.2000. ISBN 3-8007-2544-4.

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Abstract

We present a knowledge-based approach to assess the quality of DEMs. Inputs are the DEM derived from single-pass interferometry in X-band, the coherency of the interferometric pair and L-band data for land-cover classification with respect to basic height classes. Our approach uses techniques from approximate reasoning to deal with vague height information and ambiguous class assignments. The results are twofold. 1) We provide a confidence map, giving for each pixel a confidence value for the DEM. 2) Regions with low reliability (smooth surfaces, shadows) are replaced by an appropriate interpolation.

Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=2000,
Title:Knowledge-based quality assessment and improvement of digital elevation models from interferometric SAR data
Authors:
AuthorsInstitution or Email of Authors
Jäger, G.UNSPECIFIED
Benz, U.UNSPECIFIED
Scheiber, R.UNSPECIFIED
Date:2000
Journal or Publication Title:EUSAR 2000 Proceedings
Page Range:pp. 335-338
Publisher:VDE-Verlag Berlin Offenbach
ISBN:3-8007-2544-4
Status:Published
Keywords:Synthetic Aperture Radar (SAR), Digital Elevation Model (DEM), quality of DEMs, single-pass interferometry, coherency, classification, confidence map, reliability, smooth surfaces, shadows
Event Title:EUSAR 2000, München, 23.-25.05.2000
Organizer:DLR-VDE-ITG-FGAN-DaimlerCryslerAerospace
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute
Deposited By: Jens Fischer
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 19:33

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