Blumrich, Frederik (2010) Bias errors in subpixel displacement estimation for optical correlation-based measurement techniques. Optical Engineering, Vol. 49 (6), pp. 1-11. SPIE. DOI: 10.1117/1.3456595.
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The systematic error introduced when using 1-D peak detection algorithms to decompose elliptically shaped correlation peaks is investigated. First, an analytical description of this error is derived, and it is shown that this error can lead to a systematic influence of more than one pixel. Additionally, a general linear 2-D Gaussian algorithm based on least squares estimation is presented to allow correlation peak detection of elliptically shaped peaks without any significant bias error. Finally, the performance of the presented algorithms for subpixel displacement estimation, as well as algorithms provided by commercial software packages, is tested with artificial image pairs of random dot patterns.
|Additional Information:||Optical Engineering 49(6), 067004, (June 2010), SPIE Digital Library on 29 Jun 2010|
|Title:||Bias errors in subpixel displacement estimation for optical correlation-based measurement techniques|
|Journal or Publication Title:||Optical Engineering|
|In Open Access:||No|
|In ISI Web of Science:||Yes|
|Page Range:||pp. 1-11|
|Keywords:||cross-correlation, subpixel, peak detection algorithm, displacement estimation, particle image velocimetry, digital image correlation, projected pattern correlation|
|HGF - Research field:||Aeronautics, Space and Transport|
|HGF - Program:||Aeronautics|
|HGF - Program Themes:||Aircraft Research|
|DLR - Research area:||Aeronautics|
|DLR - Program:||L AR - Aircraft Research|
|DLR - Research theme (Project):||L - Flight Physics|
|Location:||Köln-Porz , Göttingen|
|Institutes and Institutions:||Executive Board > Vorstandsbüro|
Institute of Aerodynamics and Flow Technology > Experimental Methods
|Deposited By:||Ilka Micknaus|
|Deposited On:||21 Jul 2010 14:20|
|Last Modified:||07 Feb 2013 20:38|
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