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Influence of the adjacency effect on ground reflectance measurements

Richter, Rudolf and Bachmann, Martin and Dorigo, Wouter and Müller, Andreas (2006) Influence of the adjacency effect on ground reflectance measurements. IEEE Geoscience and Remote Sensing Letters, 3 (4), pp. 565-569. Institute IEEE, New York. ISSN 1545-598X.

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Document Type:Article
Title:Influence of the adjacency effect on ground reflectance measurements
Authors:
AuthorsInstitution or Email of Authors
Richter, RudolfUNSPECIFIED
Bachmann, MartinUNSPECIFIED
Dorigo, WouterUNSPECIFIED
Müller, AndreasUNSPECIFIED
Date:October 2006
Journal or Publication Title:IEEE Geoscience and Remote Sensing Letters
Refereed publication:Yes
In ISI Web of Science:Yes
Volume:3
Page Range:pp. 565-569
Publisher:Institute IEEE, New York
ISSN:1545-598X
Status:Published
Keywords:Adjacency effect, atmospheric scattering, ground measurements, surface reflectance
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):W - Vorhaben Prozesse der Landoberfläche (old)
Location: Oberpfaffenhofen
Institutes and Institutions:German Remote Sensing Data Center > Environment and Security > Environment and Geoinformation
Deposited By: Dr.-Ing. Rudolf Richter
Deposited On:16 Feb 2007
Last Modified:27 Apr 2009 13:11

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