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Comparison of MDM methods at ETW (EWA) (Part II)

Le Sant, Yves and Kirmse, Tania and Frahnert, Holger (2006) Comparison of MDM methods at ETW (EWA) (Part II). MOTAR - Meeting / Measurement and Observation Techniques for Aerospace Research / Chapter 1 – Advanced Measuring Techniques, 2006-04-06 - 2006-04-07, Berlin, Germany.

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The Model Deformation Measurement (MDM) methods of DLR, Onera and ETW have been compared in a wind tunnel test conducted within the EWA workshop “Measurement of wing deformation at ETW”. The participating partners used the same stereo camera system, but different calibration procedures were applied. The introduced MDM method “Image pattern correlation Technique” (IPCT) uses a random dot pattern instead of discrete markers which are used as targets by the MDM method of ONERA and ETW. The comparison of the results for the different methods showed a good consistency.

Document Type:Conference or Workshop Item (Speech)
Additional Information:14 Folien
Title:Comparison of MDM methods at ETW (EWA) (Part II)
AuthorsInstitution or Email of Authors
Le Sant, YvesONERA, France
Frahnert, HolgerUNSPECIFIED
Refereed publication:No
In ISI Web of Science:No
Series Name:CD-ROM Minutes of the DLR/ONERA Meeting
Keywords:Model Deformation Measurement (MDM) methods, Image pattern correlation Technique (IPCT)
Event Title:MOTAR - Meeting / Measurement and Observation Techniques for Aerospace Research / Chapter 1 – Advanced Measuring Techniques
Event Location:Berlin, Germany
Event Type:international Conference
Event Dates:2006-04-06 - 2006-04-07
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:Aircraft Research
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Flight Physics
Location: Göttingen
Institutes and Institutions:Institute of Aerodynamics and Flow Technology > Experimental Methods
Deposited By: Ilka Micknaus
Deposited On:30 Oct 2006
Last Modified:27 Apr 2009 12:58

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