Method for high-accuracy reflectance measurements in the 2.5 micron region
Richter, R. and Müller, A. (2003) Method for high-accuracy reflectance measurements in the 2.5 micron region. Applied Optics, 42 (6), pp. 1082-1090.
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| Document Type: | Article | ||||||
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| Additional Information: | LIDO-Berichtsjahr=2003, | ||||||
| Title: | Method for high-accuracy reflectance measurements in the 2.5 micron region | ||||||
| Authors: |
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| Date: | 2003 | ||||||
| Journal or Publication Title: | Applied Optics | ||||||
| Refereed publication: | Yes | ||||||
| In ISI Web of Science: | Yes | ||||||
| Volume: | 42 | ||||||
| Page Range: | pp. 1082-1090 | ||||||
| Status: | Published | ||||||
| Keywords: | reflectance measurements, thermal radiation | ||||||
| HGF - Research field: | Aeronautics, Space and Transport | ||||||
| HGF - Program: | Space | ||||||
| HGF - Program Themes: | W EO - Erdbeobachtung | ||||||
| DLR - Research area: | Space | ||||||
| DLR - Program: | W EO - Erdbeobachtung | ||||||
| DLR - Research theme (Project): | UNSPECIFIED | ||||||
| Location: | Oberpfaffenhofen | ||||||
| Institutes and Institutions: | German Remote Sensing Data Center | ||||||
| Deposited By: | elib DLR-Beauftragter | ||||||
| Deposited On: | 16 Sep 2005 | ||||||
| Last Modified: | 06 Jan 2010 12:18 |
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