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Method for high-accuracy reflectance measurements in the 2.5 micron region

Richter, R. and Müller, A. (2003) Method for high-accuracy reflectance measurements in the 2.5 micron region. Applied Optics, 42 (6), pp. 1082-1090.

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Document Type:Article
Additional Information: LIDO-Berichtsjahr=2003,
Title:Method for high-accuracy reflectance measurements in the 2.5 micron region
Authors:
AuthorsInstitution or Email of Authors
Richter, R.UNSPECIFIED
Müller, A.UNSPECIFIED
Date:2003
Journal or Publication Title:Applied Optics
Refereed publication:Yes
In ISI Web of Science:Yes
Volume:42
Page Range:pp. 1082-1090
Status:Published
Keywords:reflectance measurements, thermal radiation
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:German Remote Sensing Data Center
Deposited By: elib DLR-Beauftragter
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 12:18

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