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Simulation model for the scanning of surfaces by mechanical profiling systems.
Kratz, F. (1995) Simulation model for the scanning of surfaces by mechanical profiling systems. QM 95 "International Seminar on Quantitative Microscopy", Braunschweig, 04.-05.10.1995.
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| Document Type: | Conference or Workshop Item (Speech) | ||||
|---|---|---|---|---|---|
| Additional Information: | LIDO-Berichtsjahr=1995, | ||||
| Title: | Simulation model for the scanning of surfaces by mechanical profiling systems. | ||||
| Authors: |
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| Date: | 1995 | ||||
| Status: | Published | ||||
| Event Title: | QM 95 "International Seminar on Quantitative Microscopy", Braunschweig, 04.-05.10.1995 | ||||
| HGF - Research field: | UNSPECIFIED | ||||
| HGF - Program: | no assignment | ||||
| HGF - Program Themes: | no assignment | ||||
| DLR - Research area: | UNSPECIFIED | ||||
| DLR - Program: | no assignment | ||||
| DLR - Research theme (Project): | ["eprint_fieldopt_dlr_project_search_L000" not defined] | ||||
| Location: | Braunschweig | ||||
| Institutes and Institutions: | Institute of Flight Control | ||||
| Deposited By: | elib DLR-Beauftragter | ||||
| Deposited On: | 02 Apr 2006 | ||||
| Last Modified: | 27 Apr 2009 07:21 |
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