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Simulation-Based Testing of Embedded Software in Space Applications

Montenegro, Sergio and Jähnichen, Stefan and Maibaum, Olaf (2006) Simulation-Based Testing of Embedded Software in Space Applications. In: Embedded Systems - Modelling, Technology and Applications, pp. 73-82. Springer Netherland. Embedded Systems - Modelling, Technology and Applications, 2006-06-26 - 2006-06-27, Berlin. ISBN 978-1-4020-4932-3.

Full text not available from this repository.

Official URL: https://www.springerlink.com/content/n252617t5212h123/resource-secured/?target=fulltext.pdf

Abstract

This paper deals with the software-in-the-loop test approach being developed by the consortium project SiLEST (DLR, TU-Berlin, IAV, FhG FIRST, Webdynamix). We present a layer structure of the control loop that allows components of the environment simulation to be used for hardware-in-the-loop and software-in-the-loop testing of embedded systems software. The approach is specifically designed to test software behaviour in disturbed operating conditions, such as in a harsh environment, for example. In space applications, intensive radiation can corrupt computations and stored data. In addition, electronic devices such as sensors age much faster than on earth so that changed sensor deviations must be expected. Much the same is true of numerous other embedded systems, e.g. in automotive applications. Here, too, the electronic components are exposed to extreme conditions (temperature) and are subject to ageing processes.

Document Type:Conference or Workshop Item (Paper)
Title:Simulation-Based Testing of Embedded Software in Space Applications
Authors:
AuthorsInstitution or Email of Authors
Montenegro, SergioFraunhofer FIRST
Jähnichen, StefanFraunhofer FIRST
Maibaum, OlafUNSPECIFIED
Date:17 February 2006
Journal or Publication Title:Embedded Systems - Modelling, Technology and Applications
Page Range:pp. 73-82
Editors:
EditorsEmail
Hommel, UNSPECIFIED
Huanye, UNSPECIFIED
Publisher:Springer Netherland
ISBN: 978-1-4020-4932-3
Status:Published
Keywords:Embedded System, Software Test, Software in the Loop, Hardware in the Loop
Event Title:Embedded Systems - Modelling, Technology and Applications
Event Location:Berlin
Event Type:international Conference
Event Dates:2006-06-26 - 2006-06-27
Organizer:Technische Universität Berlin, Institut für Technische Informatik und Mikroelektronik in Kooperation mit der Shanghai Jiao Tong University
HGF - Research field:other
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:no assignement
DLR - Program:no assignment
DLR - Research theme (Project):W -- no assignement (old)
Location: Braunschweig
Institutes and Institutions:Institut of Simulation and Software Technology > Software Quality Assurance and Embedded Systems
Deposited By: Dr.rer.nat. Olaf Maibaum
Deposited On:19 Feb 2007
Last Modified:14 Jan 2010 20:58

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